Publications Robert P.W. Duin

Publications Robert P.W. Duin


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Supervised PhD Theses

D. Y. Plasencia Calaña, Prototype Selection for Classification in Standard and Generalized Dissimilarity Spaces, Ph.D. thesis Delft University of Technology, 2015, September 24, 1-152.

D. Porro Munoz, Classification of continuous multi-way data via dissimilarity representation, Ph.D. thesis Delft University of Technology, 2013, October 15, 1-127.

C.V. Dinh, Learning from weakly representative data and applications in spectral image analysis, Ph.D. thesis Delft University of Technology, 2013, October 10, 1-112.

T.C.W. Landgrebe, Operating characteristics for the design and optimisation of classification systems, Ph.D. thesis Delft University of Technology, 2007, December 19, 1-208.

P. Juszczak, Learning to recognise, a study on one-class classification and active learning, Ph.D. thesis Delft University of Technology, ASCI Dissertation Series, 123, 2006, June 8, 1-164.

E. Pekalska, Dissimilarity representations in pattern recognition, Ph.D. thesis Delft University of Technology, ASCI Dissertation Series, 109, Delft, 2005, January 17, 1-344.

P. Paclik, Builiding Road Sign Classifiers, Ph.D. thesis Czech Technical University (partially supervised by R.P.W. Duin), 2004, 1-127.

M. Loog, Supervised Dimensionality Reduction and Contextual Pattern Recognition in Medical Image Processing, Ph.D. thesis Utrecht University, Image Sciences Institute, Utrecht, The Netherlands, 2004.

D. de Ridder, Adaptive methods of image processing, Ph.D. thesis Delft University of Technology, ASCI Dissertation Series, 70, Delft, 2001, December 14, 1-278.

A. Ypma, Learning methods for machine vibration analysis and health monitoring, Ph.D. thesis Delft University of Technology, ASCI Dissertation Series, 71, Delft, 2001, November 12, 1-217.

M. Skurichina, Stabilizing weak classifiers, Ph.D. thesis Delft University of Technology, Delft, 2001, October 15, 1-208.

D.M.J. Tax, One- class classification; Concept-learning in the absence of counter- examples, Ph.D. thesis Delft University of Technology, ASCI Dissertation Series, 65, Delft, 2001, June 19, 1-190.

A. Hoekstra, Generalisation in Feed Forward Neural Classifiers, Ph.D. thesis Delft University of Technology, ASCI Dissertation Series, 33, Delft, 1998, 1-128.

W.F. Schmidt, Neural pattern classifying systems, theory and experiments with trainable pattern classifiers, Ph.D. thesis Delft University of Technology, Technische Universiteit Delft, Delft, 1994, 1-210.

M.A. Kraaijveld, Small Sample Behavior of Multi-Layer Feedforward Network Classifiers: Theoretical and Practical Aspects, Ph.D. thesis Delft University of Technology, Delft University Press, Delft, 1993, 1-196.

J. Buurman, Object Recognition for Flexible Assembly Using Stereo Vision, Ph.D. thesis Delft University of Technology, Delft University Press, Delft, 1993, 1-157.

P.P. Jonker, Morphological Image Processing: Architecture and VLSI Design, Ph.D. thesis Delft University of Technology, Kluwer Technische Boeken, Deventer, 1992, 1-297.

E.R. Komen, Low-level Image Processing Architectures Compared for some Non-linear Recursive Neigbourhood Operations, Ph.D. thesis Delft University of Technology, 1990, 1-190.

Books

R.P.W. Duin and E. Pekalska, Pattern Recognition: Introduction and Terminology, eBook, 37Steps, 2015, 1-78.

E. Pekalska and R.P.W. Duin, The Dissimilarity Representation for Pattern Recognition, Foundations and Applications, World Scientific, Singapore, 2005, 1-607.

F. van der Heiden, R.P.W. Duin, D. de Ridder, and D.M.J. Tax, Classification, Parameter Estimation, State Estimation: An Engineering Approach Using MatLab, Wiley, New York, 2004, 1-440.

A. Fred, T. Caelli, R.P.W. Duin, A. Campilho, and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. Joint IAPR International Workshops SSPR 2004 and SPR 2004 (Lisbon, Portugal, August 18-20, 2004), Lecture Notes in Computer Science, 3138, Springer Verlag, Berlin, 2004, 1-1168.

T. Caelli, A. Amin, R.P.W. Duin, M. Kamel, and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. Joint IAPR International Workshops SSPR'02 and SPR'02 (Windsor, Canada, Aug.6-9), Lecture Notes in Computer Science, 2396, Springer Verlag, Berlin, 2002, 1-868.

E. Backer and R.P.W. Duin, Statistische Patroonherkenning, Delftse Uitgevers Mij., Delft, 1988, p. 330.

I.T. Young, J. Biemond, R.P.W. Duin, and J.J. Gerbrands (eds), Signal Processing III: Theories and Applications, North-Holland, Amsterdam, 1986, 1-1436.

E. Backer, R.P.W. Duin, E.S. Gelsema, C. Kamminga, M. Valeton, and A.M. Vossepoel (eds.), First Quinquennial Review 1981-1986 Dutch Society for Pattern Recognition and Image Processing, DEB Publishers, Pijnacker, 1986, 1-332.

R.P.W. Duin and N.J. Zimmerman (eds.), Van Gasontlading tot Patroonherkennen, Het Oeuvre van Prof.dr.ir. C.J.D.M. Verhagen, DEB Publishers, Pijnacker, 1980.

R.P.W. Duin, On the accuracy of Statistical Pattern Recognizers, Ph.D. thesis Delft University of Technology, DEB Publishers, Pijnacker, 1978, 1-127.

Journal Publications

R.P.W. Duin, The Dissimilarity Representation for finding Universals from Particulars by an anti-essentialist Approach, Pattern Recognition Letters, vol. 64, 2015, 37-43.

R.C. Wilson, E. Hancock, E. Pekalska, and R.P.W. Duin, Spherical and Hyperbolic Embeddings of Data, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 36, no. 11, 2014, 2255-2269.

O. Rajadell Rojas, P. Garcia-Sevilla, C.V. Dinh, and R.P.W. Duin, Improving hyperspectral pixel classification with unsupervised training selection, Geoscience and Remote Sensing Letters, vol. 11, no. 3, 2014, 656-660.

Y. Plasencia-Calana, M. Orozco-Alzate, E. Garcia-Reyes, and R.P.W. Duin, Selecting feature lines in generalized dissimilarity representations for pattern recognition, Digital Signal Processing, vol. 23, no. 3, 2013, 902-911.

Y. Li, D.M.J. Tax, R.P.W. Duin, and M. Loog, Multiple-instance learning as a classifier combining problem, Pattern Recognition, vol. 46, no. 3, 2013, 865-874.

R. Leitner, M. De Biasio, T. Arnold, C.V. Dinh, M. Loog, and R.P.W. Duin, Multi-spectral video endoscopy system for the detection of cancerous tissue, Pattern Recognition Letters, vol. 34, no. 1, 2013, 85-93.

C.V. Dinh, R.P.W. Duin, I. Piqueras-Salazar, and M. Loog, FIDOS: A generalized Fisher based feature extraction method for domain shift, Pattern Recognition, vol. 49, no. 9, 2013, 2510-2518.

W.R. Lee, V. Cheplygina, D.M.J. Tax, M. Loog, and R.P.W. Duin, Bridging Structure and Feature Representations in Graph Matching, International Journal of Pattern Recognition and Artificial Intelligence, vol. 26, no. 5, 2012.

R.P.W. Duin and E. Pekalska, The dissimilarity space: Bridging structural and statistical pattern recognition, Pattern Recognition Letters, vol. 33, no. 7, 2012, 826-832.

D. Porro Munoz, R.P.W. Duin, M. Orozco-Alzate, I. Talavera, and J.M. Londono-Bonilla, The Dissimilarity Representation as a Tool for Three-way Data Classification using 2D Measures, Signal Processing, vol. 91, no. 11, 2011, 2520-2529.

D. Porro Munoz, I. Talavera, R.P.W. Duin, N. Hernandez, and M. Orozco- Alzate, Dissimilarity Representation on Functional Spectral Data for Classification, Journal of Chemometrics, vol. 25, no. 9, 2011, 476-486.

D. Porro Munoz, I. Talavera, R.P.W. Duin, and M. Orozco-Alzate, Combining dissimilarities for three-way data classification, Computacion y Sistemas , vol. 15, no. 1, 2011, 117-127.

C.X. Zhang and R.P.W. Duin, An experimental study of one- and two-level classifier fusion for different sample sizes, Pattern Recognition Letters, vol. 32, no. 14, 2011, 1756-1767.

C.V. Dinh, R. Leitner, P. Paclik, M. Loog, and R.P.W. Duin, SEDMI: Saliency based Edge Detection in Multispectral Images, Image and Vision Computing, vol. 29, no. 8, 2011, 546-556.

A. Ulas, R.P.W. Duin, U. Castellani, M. Loog, P. Mirtuono, M. Bicego, V. Murino, M. Bellani, S. Cerruti, M. Tansella, and P. Brambilla, Dissimilarity- based Detection of Schizophrenia, International Journal of Imaging Systems and Technology, vol. 21, no. 2, 2011, 179-192.

R.P.W. Duin, D. Laurendeau, and B. Lovell (eds.), Award winning papers from the 19th International Conference on Pattern Recognition (ICPR), Pattern Recognition Letters, vol. 31, no. 8, 2010, 649-768.

N. Sen Koktas, N. Yalabik, G. Yavuzer, and R.P.W. Duin, A Multi-Classifier For Grading Knee Osteoarthritis Using Gait Analysis, Pattern Recognition Letters, vol. 31, no. 9, 2010, 898-904.

P. Juszczak, D.M.J. Tax, E. Pekalska, and R.P.W. Duin, Minimum spanning tree based one-class classifier, Neurocomputing, vol. 72, 2009, 1859-1869.

M. Orozco-Alzate, R.P.W. Duin, and C.G. Castellanos_Dominguez, A generalization of dissimilarity representations using feature lines and feature planes, Pattern Recognition Letters, vol. 30, no. 3, 2009, 242-254.

M. Bicego, E. Pekalska, D.M.J. Tax, and R.P.W. Duin, Component- based Discriminative Classification for Hidden Markov Models, Pattern Recognition, vol. 42, no. 11, 2009, 2637-2648.

B.M. Mojaradi, H. Abrishami-Moghaddam, M.J. Valadan Zoej, and R.P.W. Duin, Dimensionality Reduction of Hyperspectral Data via Spectral Feature, IEEE Transactions on Geoscience and Remote Sensing, vol. 47, no. 7, 2009, 2091-2105.

Yunlei Li, D. de Ridder, R.P.W. Duin, and M.J.T. Reinders, Integration of Prior Knowledge of Measurement Noise in Kernel Density Classification, Pattern Recognition, vol. 41, no. 1, 2008, 320-330.

T.C.W. Landgrebe and R.P.W. Duin, Efficient multiclass ROC approximation by decomposition via confusion matrix perturbation analysis, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 30, no. 5, 2008, 810-822.

S.W. Kim and R.P.W. Duin, On Optimizing Dissimilarity-Based Classifier Using Multi-level Fusion Strategies (in Korean), Journal of The Institute of Electronics Engineers of Korea, Computer and Information (CI), vol. 45, no. 5, 2008, 15-24.

S. Escalera, D.M.J. Tax, O. Pujol, P. Radeva, and R.P.W. Duin, Sub-class Problem- Dependent Design for Error-Correcting Output Codes, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 30, no. 6, 2008, 1041-1054.

H. Hashemi, D.J.M. Tax, R.P.W. Duin, A. Javaherian, and P. de Groot, Gas chimney detection based on improving the performance of combined multilayer perceptron and support vector classifier, Nonlinear Processes in Geophysics, vol. 15, no. 6, 2008, 863-871.

E. Pekalska and R.P.W. Duin, Beyond traditional kernels: classification in two dissimilarity-based representation spaces, IEEE Transactions on Systems, Man Cybernetics, vol. 38, no. 6, 2008, 729-744.

D.M.J. Tax and R.P.W. Duin, Growing a multi-class classifier with a reject option, Pattern Recognition Letters, vol. 29, no. 10, 2008, 1565-1570.

C. Marrocco, R.P.W. Duin, and F. Tortorella, Maximizing the Area Under the ROC Curve by Pairwise Feature Combination, Pattern Recognition, vol. 41, 2008, 1961-1974.

T.C.W. Landgrebe and R.P.W. Duin, A simplified volume under the ROC hypersurface, SAIEE Africa Research Journal, vol. 98, no. 3, 2007, 94-100.

T.C.W. Landgrebe and R.P.W. Duin, Approximating the multiclass ROC by pairwise analysis, Pattern Recognition Letters, vol. 28, no. 13, 2007, 1747-1758.

A. Harol, C. Lai, E. Pekalska, and R.P.W. Duin, Pairwise evaluation for the selection of features and prototypes, Pattern Analysis and Applications, vol. 10, no. 1, 2007, 55-68.

T.C.W. Landgrebe, D.M.J. Tax, P. Paclik, and R.P.W. Duin, The interaction between classification and reject performance for distance-based reject-option classifiers, Pattern Recognition Letters, vol. 27, 2006, 908-917.

R.P.W. Duin, M. Loog, and T.K. Ho, Editorial: Recent submissions in linear dimensionality reduction and face recognition, Pattern Recognition Letters, vol. 27, no. 7, 2006, 707-708.

P. Paclik, R. Leitner, and R.P.W. Duin, A study on design of object sorting algorithms in the industrial application using hyperspectral imaging., Journal of Real-Time Image Processing, vol. 1, no. 2, 2006, 101-108.

P. Paclik, J. Novovicova, and R.P.W. Duin, Building road sign classifiers using a trainable similarity measure, IEEE Transactions on Intelligent Transportation Systems, vol. 7, no. 3, 2006, 309-321.

M.P.L. Bard, A. Amelink, M. Skurichina, V. Noordhoek Hegt, R.P.W. Duin, H.J.C.M. Sterenborg, H.C. Hoogsteden, and J.G.J.V. Aerts, Optical spectroscopy for the classification of malignant lesions of the bronchial tree, Chest, vol. 129, 2006, 995-1001.

M. Orozco-Alzate, M.E. Garcia-Ocampo, R.P.W. Duin, and C.G. Castellanos_Dominguez, Dissimilarity-based classification of seismic signals at Nevado del Ruiz volcano, Earth Sciences Research Journal, vol. 10, no. 2, 2006, 57-65.

M. Lozano, J.M. Sotoca, J.S. Sanchez, F. Pla, E. Pekalska, and R.P.W. Duin, Experimental Study on Prototype Optimisation Algorithms for Dissimilarity based Classifiers, Pattern Recognition, vol. 39, no. 10, 2006, 1827-1838.

E. Pekalska, R.P.W. Duin, and P. Paclik, Prototype selection for dissimilarity-based classification, Pattern Recognition, vol. 39, no. 2, 2006, 189-208.

C. Chen, E.A. Hendriks, R.P.W. Duin, J.H.C. Reiber, P.S. Hiemstra, L.A. de Weger, and B.C. Stoel, Feasibility study on automated recognition of allergenic pollen: grass, birch and mugwort, Aerobiologia, vol. 22, no. 4, 2006, 275-284.

M.P.L. Bard, A. Amelink, M. Skurichina, M. den Bakker, S.A. Burgers, J.P. van Meerbeeck, R.P.W. Duin, J.G.J.V. Aerts, H.C. Hoogsteden, and H.J.C.M. Sterenborg, Improving the specificity of fluorescence bronchoscopy for the analysis of neoplastic lesions of the bronchial tree by combination with optical spectroscopy: preliminary communication, Lung Cancer, vol. 47, no. 1, 2005, 41-47.

M. Loog, R.P.W. Duin, and B. van Ginneken, Dimensionality reduction of image features using the canonical contextual correlation projection, Pattern Recognition, vol. 38, no. 12, 2005, 2409-2418.

D.C.G. de Veld, M. Skurichina, M.J.H. Witjes, R.P.W. Duin, H.J.C.M. Sterenborg, and J.L.N. Roodenburg, Autofluorescence and diffuse reflectance spectroscopy for oral oncology, Lasers in Surgery and Medicine, vol. 36, no. 5, 2005, 356-364.

M. Loog and R.P.W. Duin, Linear Dimensionality Reduction via a Heteroscedastic Extension of LDA: The Chernoff Criterion, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 26, no. 6, 2004, 732-739.

M. Loog, R.P.W. Duin, and M.A. Viergever, The MDF discrimination measure: Fisher in disguise, Neural Networks, vol. 17, no. 4, 2004, 563-566.

M.E.M. Musa, D. de Ridder, R.P.W. Duin, and V. Atalay, Almost autonomous training of mixtures of principal component analyzers, Pattern Recognition Letters, vol. 25, no. 9, 2004, 1085-1095.

D.M.J. Tax and R.P.W. Duin, Support Vector Data Description, Machine Learning, vol. 54, no. 1, 2004, 45-66.

D.C.G. de Veld, M. Skurichina, M.J.H. Witjes, R.P.W. Duin, D.J.C.M. Sterenborg, and J.L.N. Roodenburg, Clinical study for classification of benign, dysplastic and malignant oral lesions using autofluorescence spectroscopy, Journal of Biomedical Optics, vol. 9, no. 5, 2004, 940-950.

C. Lai, D.M.J. Tax, R.P.W. Duin, E. Pekalska, and P. Paclik, A study on combining image representations for image classification and retrieval, International Journal of Pattern Recognition and Artificial Intelligence, vol. 18, no. 5, 2004, 867-890.

P.P. Jonker, R.P.W. Duin, and D. de Ridder, Pattern recognition for metal defect detection, Steel Grips, vol. 1, no. 1, 2003, 20-23.

P. Paclik and R.P.W. Duin, Dissimilarity-based classification of spectra: computational issues, Real Time Imaging Journal, vol. 9, no. 4, 2003, 237-244.

P. Paclik, R.P.W. Duin, G.M.P. van Kempen, and R. Kohlus, Segmentation of multi- spectral images using the combined classifier approach, Image and Vision Computing Journal, vol. 21, no. 6, 2003, 473-482.

L.I. Kuncheva, C.J. Whitaker, C.A. Shipp, and R.P.W. Duin, Limits on the Majority Vote Accuracy in Classifier Fusion, Pattern Analysis and Applications, vol. 6, no. 1, 2003, 22-31.

D.C.G. de Veld, M. Skurichina, M.J.H. Witjes, R.P.W. Duin, D.J.C.M. Sterenborg, W.M. Star, and J.L.N. Roodenburg, Autofluorescence Characteristics of Healthy Oral Mucosa at Different Anatomical Sites, Lasers in Surgery and Medicine, vol. 32, no. 5, 2003, 367-376.

R.P.W. Duin, F. Roli, and D. de Ridder, A note on core research issues for statistical pattern recognition, Pattern Recognition Letters, vol. 23, no. 4, 2002, 493-499.

M. Skurichina and R.P.W. Duin, Bagging, Boosting and the Random Subspace Method for Linear Classifiers, Pattern Analysis and Applications, vol. 5, no. 2, 2002, 121-135.

L.I. Kuncheva, M. Skurichina, and R.P.W. Duin, An experimental study on diversity for bagging and boosting with linear classifiers, Information Fusion, vol. 3, 2002, 245-258.

E. Pekalska and R.P.W. Duin, Dissimilarity representations allow for building good classifiers, Pattern Recognition Letters, vol. 23, no. 8, 2002, 943-956.

E. Pekalska, P. Paclik, and R.P.W. Duin, A Generalized Kernel Approach to Dissimilarity-based Classification, Journal of Machine Learning Research, Special Issue on Kernel Methods, vol. 2, no. 2, 2002, 175-211.

D.M.J. Tax and R.P.W. Duin, Uniform Object Generation for Optimizing One-class Classifiers, Journal of Machine Learning Research, Special Issue on Kernel Methods, vol. 2, no. 2, 2002, 155-173.

A. Ypma, A. Leshem, and R.P.W. Duin, Blind separation of rotating machine sources: bilinear forms and convolutive mixtures, Neurocomputing, vol. 49, 2002, 349-368.

M. Loog, R.P.W. Duin, and R. Haeb-Umbach, Multiclass Linear Dimension Reduction by Weighted Pairwise Fisher Criteria, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 23, no. 7, 2001, 762-766.

L.I. Kuncheva, J.C. Bezdek, and R.P.W. Duin, Decision Templates for Multiple Classifier Fusion: An Experimental Comparison, Pattern Recognition, vol. 34, no. 2, 2001, 299-314.

E. Pekalska and R.P.W. Duin, Automatic pattern recognition by similarity representations, Electronics Letters, vol. 37, no. 3, 2001, 159-160.

M. Skurichina, S. Raudys, and R.P.W. Duin, K-Nearest Neighbors Directed Noise Injection in Multilayer Perceptron Training, IEEE Transactions on Neural Networks, vol. 11, no. 2, 2000, 504-511.

D.M.J. Tax, M. van Breukelen, R.P.W. Duin, and J. Kittler, Combining multiple classifiers by averaging or by multiplying?, Pattern Recognition, vol. 33, no. 9, 2000, 1475-1485.

A.K. Jain, R.P.W. Duin, and J. Mao, Statistical Pattern Recognition: A Review, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 22, no. 1, 2000, 4-37.

R.P.W. Duin, Simulated consciousness in automatic pattern recognition, Dialogues in Psychology: A Journal of Theory and Metatheory, vol. 4, http://hubcap.clemson.edu/psych/Dialogues/dialogues.html, 1999.

R.P.W. Duin, E. Pekalska, and D. de Ridder, Relational discriminant analysis, Pattern Recognition Letters, vol. 20, no. 11-13, 1999, 1175-1181.

M. Skurichina and R.P.W. Duin, Regularization of linear classifiers by adding redundant features, Pattern Analysis and Applications, vol. 2, no. 1, 1999, 44-52.

D.M.J. Tax and R.P.W. Duin, Support vector domain description, Pattern Recognition Letters, vol. 20, no. 11-13, 1999, 1191-1199.

D. de Ridder, R.P.W. Duin, P.W. Verbeek, and L.J. van Vliet, The applicability of neural networks to non-linear image processing, Pattern Analysis and Applications, vol. 2, no. 2, 1999, 111-128.

S. Raudys and R.P.W. Duin, On expected classification error of the Fisher linear classifier with pseudo-inverse covariance matrix, Pattern Recognition Letters, vol. 19, no. 5-6, 1998, 385-392.

R.P.W. Duin, D. de Ridder, and D.M.J. Tax, Featureless Pattern Classification, Kybernetika, vol. 34, no. 4, 1998, 399-404.

M. van Breukelen, R.P.W. Duin, D.M.J. Tax, and J.E. den Hartog, Handwritten digit recognition by combined classifiers, Kybernetika, vol. 34, no. 4, 1998, 381-386.

M. Skurichina and R.P.W. Duin, Bagging for linear classifiers, Pattern Recognition, vol. 31, no. 7, 1998, 909-930.

J. Kittler, M. Hatef, R.P.W. Duin, and J. Matas, On Combining Classifiers, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 20, no. 3, 1998, 226-239.

R.P.W. Duin, D. de Ridder, and D.M.J. Tax, Experiments with object based discriminant functions; a featureless approach to pattern recognition, Pattern Recognition Letters, vol. 18, no. 11-13, 1997, 1159-1166.

D. de Ridder and R.P.W. Duin, Sammon's mapping using neural networks: a comparison, Pattern Recognition Letters, vol. 18, no. 11-13, 1997, 1307-1316.

A. Hoekstra and R.P.W. Duin, Investigating Redundancy in Feed Forward Neural Classifiers, Pattern Recognition Letters, vol. 18, no. 11-13, 1997, 1293-1300.

R.P.W. Duin, Neural networks and pattern recognition: two steps closer; book review, Computer Journal, vol. 39, no. 6, 1996, 557-558.

R.P.W. Duin, A note on comparing classifiers, Pattern Recognition Letters, vol. 17, no. 5, 1996, 529-536.

G.A.P. Fontaine, E.E.E. Frietman, and R.P.W. Duin, Preventive and predictive machine maintenance using neural networks, Journal of Microelectronic Systems Integration, vol. 4, no. 2, 1996, 87-93.

P.J. Verveer and R.P.W. Duin, An evaluation of intrinsic dimensionality estimators, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 17, no. 1, 1995, 81-86.

R.P.W. Duin, Superlearning and neural network magic (IAPR discussion pages), Pattern Recognition Letters, vol. 15, no. 3, 1994, 215-217.

M.A. Kraaijveld and R.P.W. Duin, An optimal stopping criterion for backpropagation learning, Neural Network World, vol. 1, no. 6, 1991, 365-370.

W.B. Teeuw and R.P.W. Duin, An algorithm for benchmarking a SIMD pyramid with the Abingdon cross, Pattern Recognition Letters, vol. 11, no. 7, 1990, 501-506.

H.W. Lincklaen Westenberg, S. de Jong, D.A. van Meel, J.F.A. Quadt, E. Backer, and R.P.W. Duin, Fuzzy set theory applied to product classification by sensory panel, Journal of Sensory Studies, vol. 4, 1989, 55-72.

R.P.W. Duin, H. Haringa, and R. Zeelen, Fast percentile filtering, Pattern Recognition Letters, vol. 4, no. 4, 1986, 269-272.

L. Dorst and R.P.W. Duin, Spirograph theory: a framework for calculations on digitized straight lines, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 6, no. 5, 1984, 632-639.

R.P.W. Duin, The use of continuous variables for labeling objects, Pattern Recognition Letters, vol. 1, no. 1, 1982, 15-20.

F.T. Beukema toe Water and R.P.W. Duin, Dealing with a priori knowledge by fuzzy labels, Pattern Recognition, vol. 14, 1981, 111-115.

C.J.D.M. Verhagen, R.P.W. Duin, F.C.A. Groen, J.C. Joosten, and P.W. Verbeek, Progress report on pattern recognition, Reports on Progress in Physics, vol. 43, no. 6, 1980, 785-831.

R.P.W. Duin, The mean recognition performance for independent distributions, IEEE Transactions on Information Theory, vol. IT-24, no. 3, 1978, 394-395.

R.P.W. Duin, C.E. van Haersma Buma, and L. Roosma, On the evaluation of independent binary features, IEEE Transactions on Information Theory, vol. IT-24, no. 2, 1978, 248-249.

R.P.W. Duin, Comments on 'Independence, Measurement Complexity and Classification Performance', IEEE Transactions on Systems, Man, and Cybernetics, vol. SMC-7, no. 3, 1977, 559-560.

R.P.W. Duin, On the choice of the smoothing parameters for Parzen estimators of probability density functions, IEEE Transactions on Computers, vol. C-25, no. 11, 1976, 1175-1179.

M. de Bruin, P.J.M. Korthoven, A.J van der Steen, J.P.W. Houtman, and R.P.W. Duin, The use of a trace element concentrations in the determination of objects, Archaeometry, vol. 18, no. 1, 1976, 75-83.

C.E. van Haersma Buma and R.P.W. Duin, Computation of concave piecewise linear discriminant functions using Chebyshev polynomials, IEEE Transactions on Computers, vol. C-25, no. 2, 1976, 178-186.

M. de Bruin, P.J.M. Korthoven, R.P.W. Duin, F.C.A. Groen, and C.C. Bakels, Pattern recognition as a statistical method for analyzing the confidence level in the identification of objects, Journal of Radioanalytical Chemistry, vol. 15, 1973, 181-191.

R.P.W. Duin, Het patroonherkennend systeem en enkele hierin toepasbare technieken, De Ingenieur, vol. 83, no. 40, 1971, ET-129 - ET-133.

Book Sections

R.P.W. Duin, E. Pekalska, and M. Loog, Non-Euclidean Dissimilarities: Causes, Embedding and Informativeness, in: M. Pelillo (eds.), Similarity-Based Pattern Analysis and Recognition, Advances in Computer Vision and Pattern Recognition, Springer, 2013, 13-44.

S. Escalera, D.M.J. Tax, O. Pujol, P. Radeva, and R.P.W. Duin, Multi-class Classification in Image Analysis via Error-Correcting Output Codes, in: H. Kwasnicka, L.C. Jain (eds.), Innovations in Intelligent Image Analysis, SCI, vol. 339, Springer, Berlin, 2011, 7-29.

R.P.W. Duin, Non- Euclidean Problems in Pattern Recognition Related to Human Expert Knowledge, in: J. Filipe, J. Cordeiro (eds.), Enterprise Information Systems, Revised Selected Papers ICEIS 2010, Lecture Notes in Business Information Processing, vol. 73, Springer, 2011, 15-28.

R.P.W. Duin, M. Loog, E. Pekalska, and D.M.J. Tax, Feature-based Dissimilarity Space Classification, in: D. Ünay, Z.Çataltepe, and S. Aksoy (eds.), Recognizing Patterns in Signals, Speech, Images, and Videos, ICPR 2010, Lecture Notes in Computer Science, vol. 6388, Springer, 2010, 46-55.

R.P.W. Duin and E. Pekalska, The Science of Pattern Recognition; Achievements and Perspectives, in: W. Duch, J. Mandziuk (eds.), Challenges for Computational Intelligence, Studies in Computational Intelligence, vol. 63, Springer, 2007, 221-259.

R.P.W. Duin and E. Pekalska, Object representation, sample size and data complexity, in: M. Basu and T.K. Ho (eds.), Data Complexity in Pattern Recognition, Springer, London, 2006, 25-47.

R.P.W. Duin and D.M.J. Tax, Statistical Pattern Recognition, in: C.H. Chen, P.S.P. Wang (eds.), Handbook of Pattern Recognition and Computer Vision, 3rd edition, World Scientific, Singapore, 2005, 3-24.

A.K. Jain and R.P.W. Duin, Pattern Recognition, in: R.L. Gregory (eds.), The Oxford Companion to the Mind, Second Edition, Oxford University Press, Oxford, UK, 2004, 698-703.

D. de Ridder, R.P.W. Duin, M. Egmont-Petersen, L.J. van Vliet, and P.W. Verbeek, Nonlinear Image Processing using Artificial Neural Networks, in: P. Hawkes (eds.), Advances in Imaging and Electron Physics, vol. 126, Elsevier Science, Amsterdam, 2003, 351-450.

D.M.J. Tax and R.P.W. Duin, Feature scaling in support vector data descriptions, in: N. Japkowicz (eds.), Learning from Imbalanced Data Sets, AAAI Press, Menlo Park, CA, 2000, 25-30.

A. Hoekstra, R.P.W. Duin, and M.A. Kraaijveld, Neural Networks Applied to Data Analysis, in: C.T. Leondes (eds.), Neural Network Systems Techniques and Applications, vol. 3: Implementation Techniques, Academic Press, 1998, 309-370.

R.P.W. Duin, E.E.E. Frietman, A. Hoekstra, R. Ligteringen, D. de Ridder, M. Skurichina, D.M.J. Tax, and A. Ypma, The use of neural network tools in statistical pattern recognition, in: B. Kappen, S. Gielen (eds.), Neural Networks: Best Practice in Europe, Progress in Neural Processing, vol. 8, World Scientific, Singapore, 1997, 165-168.

R. Ligteringen, A. Ypma, R.P.W. Duin, and E.E.E. Frietman, Fault diagnosis of rotating machinery by neural networks, in: B. Kappen, S. Gielen (eds.), Neural Networks: Best Practice in Europe, Progress in Neural Processing, vol. 8, World Scientific, Singapore, 1997, 161-164.

A. Ypma and R.P.W. Duin, Novelty detection using self-organizing maps, in: N. Kasabov, R. Kozma, K. Ko, R. O'Shea, G. Goghill, T. Gedeon (eds.), Progress in Connectionist-Based Information Systems, Vol.II, Springer Verlag, Berlin, 1997, 1322-1325.

A. Ypma, D.M.J. Tax, and R.P.W. Duin, Between ship noise and gas leak: reliable gas leak detection, in: B. Kappen, S. Gielen (eds.), Neural Networks: Best Practice in Europe, Progress in Neural Processing, vol. 8, World Scientific, Singapore, 1997, 157-160.

M.A. Kraaijveld and R.P.W. Duin, On the capacity of feedforward networks with shared weights, in: D.W. Ruck (eds.), Science of Artificial Neural Networks, Proc. SPIE, vol. 1710, 1992, 406-414.

R.P.W. Duin, The use of fuzzy labels in a probabilistic context, in: J.J. Gerbrands, F.C.A. Groen, C. Kamminga, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Second Quinquennial Review, Nederlandse Vereniging voor Patroonherkenning en Beeldverwerking, Delft, 1991, 1-8.

R.P.W. Duin, A triangulation of the field of pattern recognition, in: J.J. Gerbrands, F.C.A. Groen, C. Kamminga, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Second Quinquennial Review 1986-1991, Nederlandse Vereniging voor Patroonherkenning en Beeldverwerking, Delft, 1991, p. 6.

M.A. Kraaijveld and R.P.W. Duin, How much can we learn from examples?, in: J.J. Gerbrands, F.C.A. Groen, C. Kamminga, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Second Quinquennial Review, Nederlandse Vereniging voor Patroonherkenning en Beeldverwerking, Delft, 1991, p. 12.

R.P.W. Duin and P.P. Jonker, Processor arrays compared to pipelines for cellular image processing, in: S. Levialdi (eds.), Multicomputer Vision, Academic Press, London, 1988, 151-169.

R.P.W. Duin and E. Backer, Discriminant analysis in a non-probabilistic context based on fuzzy labels, in: E.S. Gelsema, L.N. Kanal (eds.), Pattern Recognition and Artificial Intelligence - Towards an Integration, North Holland, Amsterdam, 1988, 229-235.

J. Buurman and R.P.W. Duin, Implementation and use of software scanning on a small CLIP4 processor array, in: J. Kittler (eds.), Pattern Recognition, Lecture Notes in Computer Science, vol. 301, Springer Verlag, Berlin, 1988, 269-277.

F.C.A. Groen, P.P. Jonker, and R.P.W. Duin, Hardware versus software implementations of fast image processing algorithms, in: Anil K. Jain (eds.), Real-Time Object Measurement and Classification, NATO ASI Series, vol. F42, Springer-Verlag, Heidelberg, 1988, 73-91.

A.W.M. Smeulders, G. Bosveld, and R.P.W. Duin, The classification of (cell) samples using the population function, in: R. Salomon, B. Blum, M. Jorgenson (eds.), Medinfo-86 (Washington, DC, Oct.26-30), Elsevier Scientific Publishers, Amsterdam, 1986, 649-652.

R.P.W. Duin, Software systems for image processing, in: N.J. Zimmerman, A. Oosterlinck (eds.), Industrial Applications of Image Analysis, DEB Publishers, Pijnacker, 1983, 141-152.

C.J.D.M. Verhagen, R.P.W. Duin, F.A. Gerritsen, F.C.A. Groen, J.C. Joosten, and P.W. Verbeek, Pattern recognition, in: P. Sydenham (eds.), Handbook of Measurement Science Fundamentals, Wiley, London, 1982.

J.W. Raatgever and R.P.W. Duin, On the variable kernel method for multivariate nonparametric density estimation, in: L.C.A. Corsten, J. Hermans (eds.), Compstat 1978, 1978, 524-533.

Conferences

Y. Plasencia-Calana, Y. Li, R.P.W. Duin, M. Orozco Alzate, M. Loog, and E. Garcia-Reyes, A Compact Representation of Multiscale Dissimilarity Data by Prototype Selection, Proc. CIARP 2016, Lecture Notes in Computer Science, Springer, Heidelberg, 2016.

W.J. Lee, D.M.J. Tax, and R.P.W. Duin, Beyond Condition-Monitoring: Comparing Diagnostic Events with Word Sequence Kernel for Train Delay Prediction, Proceedings European Conference of the Prognostic and Health Management Society 2016, 2016.

R.P.W. Duin and E. Pekalska, Zero-error dissimilarity based classifiers, arXiv:1601.04451, 2016, 1-5.

R.P.W. Duin and E. Pekalska, Domain based classification, arXiv:1601.04530, 2016, 1-8.

M. Orozco-Alzate, R.P.W. Duin, and M. Bicego, Unsupervised Parameter Estimation of Non Linear Scaling for Improved Classification in the Dissimilarity Space, Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR 2016, Lecture Notes in Computer Science, vol. 10029, Springer, Heidelberg, 2016, 74-83.

D.M.J. Tax, V. Cheplygina, R.P.W. Duin, and J. van de Poll, The Similarity between Dissimilarities, Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR 2016, Lecture Notes in Computer Science, vol. 10029, Springer, Heidelberg, 2016, 84-94.

Y. Plasencia-Calana, M. Orozco-Alzate, H. Mendez-Vazquez, E. Garcia-Reyes, E. Garcia-Reyes, and R.P.W. Duin, Towards Scalable Prototype Selection by Genetic Algorithms with Fast Criteria, Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR 2014, Lecture Notes in Computer Science, vol. 8621, Springer, Heidelberg, 2014, 343-352.

R.P.W. Duin, M. Bicego, M. Orozco-Alzate, S.W. Kim, and M. Loog, Metric Learning in Dissimilarity Space for Improved Nearest Neighbor Performance, Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR 2014, Lecture Notes in Computer Science, vol. 8621, Springer, Heidelberg, 2014, 183-192.

Y. Plasencia-Calana, V. Cheplygina, R.P.W. Duin, E. Garcia-Reyes, M. Orozco-Alzate, D.M.J. Tax, and M. Loog, On the Informativeness of Asymmetric Dissimilarities, in: E. Hancock, M. Pelillo (eds.), Similarity-Based Pattern Recognition (Proc. Second Int. Workshop, SIMBAD 2013, York, UK), Lecture Notes in Computer Science, vol. 7953, Springer, Berlin, 2013, 75-89.

Y. Plasencia-Calana, M. Orozco-Alzate, E. Garcia-Reyeso, and R.P.W. Duin, Towards cluster- based prototype sets for classification in the dissimilarity space, in: J. Ruiz-Shulcloper and G. Sanniti di Baja (eds.), Proc. CIARP 2013, Part I, Lecture Notes in Computer Science, vol. 8258, Springer, Heidelberg, 2013, 294-301.

Y. Li, D.M.J. Tax, R.P.W. Duin, and M. Loog, The Link between Multiple-Instance Learning and Learning from Only Positive and Unlabelled Examples, Proc. MCS 2013, Lecture Notes in Computer Science, vol. 7872, Springer, Heidelberg, 2013, 157-166.

H. Aidos, A. Fred, and R.P.W. Duin, The area under the ROC curve as a criterion for clustering evaluation, ICPRAM 2013 - Proc. 2nd Int. Conf. on Pattern Recognition Applications and Methods, (Barcelona, Spain, 15-18 Feb., 2013), SciTePress, 2013, 276-280.

D. Porro Munoz, R.P.W. Duin, and I. Talavera, Missing values in dissimilarity-based classification of multi-way data, Proc. CIARP 2013, 2013.

Y. Plasencia-Calana, E. Garcia-Reyes, R.P.W. Duin, and M. Orozco-Alzate, On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces, in: L. Alvarez, M. Mejail, L. Gomez, J. Jacobo (eds.), Proc. CIARP 2012, Lecture Notes in Computer Science, vol. 7441, Springer, 2012, 503-510.

Y. Li, R.P.W. Duin, and M. Loog, Combining Multi- Scale Information Using Dissimilarities, Proc. 21st International Conference on Pattern Recognition (ICPR 2012), 2012, 1639-1642.

V. Cheplygina, D.M.J. Tax, R.P.W. Duin, W.R. Lee, and M. Loog, Bag Dissimilarities for Multiple Instance Learning, Proc. Benelearn 2012, 2012, p. 82.

R.P.W. Duin, A.L.N. Fred, M. Loog, and E. Pekalska, Mode Seeking Clustering by KNN and Mean Shift Evaluated, in: G. Gimelfarb, E. Hancock, A. Imiya, A. Kuijper, M. Kudo, S. Omachi, T. Windeatt, K. Yamada (eds.), Proc. SSPR & SPR 2012, Lecture Notes in Computer Science, vol. 7626, Springer, Heidelberg, 2012, 51-59.

M. Loog and R.P.W. Duin, The Dipping Phenomenon, in: G. Gimelfarb, E. Hancock, A. Imiya, A. Kuijper, M. Kudo, S. Omachi, T. Windeatt, K. Yamada (eds.), Proc. SSPR & SPR 2012, Lecture Notes in Computer Science, vol. 7626, Springer, Heidelberg, 2012, 310-317.

M.J. Gangeh, R.P.W. Duin, B.M. ter Haar Romeny, and M.S. Kamel, A Two-Stage Combined Classifier in Scale Space Texture Classification, CoRR, vol. abs/1207.4089, 2012.

H. Kalkan, M. Nap, R.P.W. Duin, and M. Loog, Automated Colorectal Cancer Diagnosis for Whole-Slice Histopathology, Proc. MICCAI , 2012, 550-557.

H. Kalkan, M. Nap, R.P.W. Duin, and M. Loog, Automated Classification of Local Patches in Colon Histopathology, Proc. 21st International Conference on Pattern Recognition (ICPR 2012), 2012, 61-64.

H. Aidos, A. Fred, and R.P.W. Duin, Classification using high order dissimilarities in non-Euclidean spaces, in: P. Latorre Carmona, J. Salvador Sanchez, A.L.N. Fred}, (eds.), ICPRAM 2012 - Proc. 1st Int. Conf. on Pattern Recognition Applications and Methods, Volume 1, (Vilamoura, Algarve, Portugal, 6-8 Feb., 2012), SciTePress, Portugal, 2012, 306-309.

D. Porro Munoz, R.P.W. Duin, M. Orozco-Alzate, and I. Talavera, Continuous Multi-way Shape Measure for Dissimilarity Representation, in: L. Alvarez, M. Mejail, L. Gomez, J. Jacobo (eds.), Proc. CIARP 2012, Lecture Notes in Computer Science, vol. 7441, Springer, 2012, 430-437.

C.V. Dinh, R.P.W. Duin, and M. Loog, A study on semi- supervised dissimilarity representation, Proc. 21st International Conference on Pattern Recognition (ICPR 2012), 2012, 2861-2864.

C.V. Dinh, R.P.W. Duin, M. Loog, R. Leitner, and O. Rajadell, Training Data Selection for Cancer Detection in Multispectral Endoscopy Images, Proc. 21st International Conference on Pattern Recognition (ICPR 2012), 2012, 161-164.

A. Ibba, M. Loog, and R.P.W. Duin, Supervised localization of cell nuclei on TMA images, Proc. WACV MMBIA, 2012, 4321-4327.

Y. Plasencia-Calana, E. Garcia-Reyes, R.P.W. Duin, and M. Orozco-Alzate, A New Method for Prototype Selection in Dissimilarity Spaces, Proc. Cuban Pattern Recognition Conference 2011, 2011.

W.J. Lee, R.P.W. Duin, and M. Loog, Generalized Augmentation of Multiple Kernels, in: C. Sansone, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 10th Int. Workshop, MCS 2011, Naples, Italy), Lecture Notes in Computer Science, vol. 6713, Springer, Berlin, 2011, 116-125.

S.W. Kim and R.P.W. Duin, Dissimilarity-Based Classifications in Eigenspaces, in: César San Martín, Sang-Woon Kim (eds.), Proc. CIARP 2011, Lecture Notes in Computer Science, vol. 7042, Springer, 2011, 425-432.

R.P.W. Duin and E. Pekalska, The dissimilarity representation for structural pattern recognition, in: César San Martín, Sang-Woon Kim (eds.), Proc. CIARP 2011, Lecture Notes in Computer Science, vol. 7042, Springer, 2011, 1-24.

O. Rajadell Rojas, P. Garcia-Sevilla, R.P.W. Duin, and C.V. Dinh, Semi-supervised hyperspectral pixel classification using interactive labeling, Proc. Whispers, 3rd Workshop on Hyperspectral Image and Signal Processing : Evolution in Remote Sensing, 2011.

O. Rajadell Rojas, C.V. Dinh, R.P.W. Duin, and P. Garcia-Sevilla, Selection of samples for active labeling in semi-supervised hyperspectral pixel classification, SPIE Conference 8180, Image and Signal Processing for Remote Sensing, Prague, 19-21 Sept 2011, 2011.

D. Porro Munoz, R.P.W. Duin, I. Talavera, and M. Orozco-Alzate, A study on the infuence of shape in classifying small spectral data sets, Similarity-Based Pattern Recognition (Proc. First Int. Workshop, SIMBAD 2011, Venice, Italy), Lecture Notes in Computer Science, vol. 7005, Springer, Berlin, 2011, 306-320.

D.M.J. Tax, M. Loog, R.P.W. Duin, V. Cheplygina, and W.R. Lee, Bag Dissimilarities for Multiple Instance Learning, Similarity-Based Pattern Recognition (Proc. First Int. Workshop, SIMBAD 2011, Venice, Italy), Lecture Notes in Computer Science, vol. 7005, Springer, Berlin, 2011, 222-234.

C.V. Dinh, R. Leitner, O.R. Rajadell Rojas, M. Loog, and R.P.W. Duin, A Study of Detecting Cancer Tissues in Multispectral Endoscopy Data, Proc. ICT.OPEN, 2011.

A. Ibba, M. Loog, and R.P.W. Duin, Supervised localization of cell nuclei using dissimilarities, Proc. ICT.OPEN, 2011.

Y. Plasencia-Calana, E. Garcia-Reyes, M. Orozco-Alzate, and R.P.W. Duin, Prototype selection for dissimilarity representation by a genetic algorithm, ICPR 2010, 2010, 177-180.

W.J. Lee, R.P.W. Duin, and H. Bunke, Selecting Structural Base Classifiers for Graph-based Multiple Classifier Systems, in: N. El Gayar, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 9th Int. Workshop, MCS 2010, Cairo, Egypt), Lecture Notes in Computer Science, vol. 5997, Springer, Berlin, 2010, 155-164.

W.J. Lee, R.P.W. Duin, A. Ibba, and M. Loog, An Experimental Study On Combining Euclidean Distances, Proc. The 2nd International IAPR Workshop on Cognitive Information Processing (14-15-16 June, 2010 Elba Island, Tuscany - Italy), IEEE, 2010, 304-309.

S.W. Kim and R.P.W. Duin, On Improving Dissimilarity-Based Classifications Using a Statistical Similarity Measure, in: I. Bloch, R.M. Cesar Jr. (eds.), Proc. CIARP 2010, Lecture Notes in Computer Science, vol. 6419, Springer, 2010, 418-425.

S.W. Kim and R.P.W. Duin, An emperical comparison of kernel-based and dissimilarity-based feature spaces, in: E.R. Hancock et al. (Eds.) (eds.), Proc. SSPR & SPR 2010, Lecture Notes in Computer Science, vol. 6218, Springer, Heidelberg, 2010, 559-568.

S. Klein, M. Loog, F. van der Lijn, T. den Heijer, A. Hammers, M. de Bruijne, A. van der Lugt, R.P.W. Duin, M.M.B. Breteler, and W.J. Niessen, Early diagnosis of dementia based on intersubject whole-brain dissimilarities, Proc. of IEEE International Symposium on Biomedical Imaging: Macro to Nano (Rotterdam, 14-17 April 2010), 2010, 249-252.

R. Wilson, E.R. Hancock, E. Pekalska, and R.P.W. Duin, Spherical Embeddings for non-Euclidean Dissimilarities, Proc. CVPR 2010, 2010, 1903-1910.

R.P.W. Duin, Pattern Recognition as a Human Centered non-Euclidean Problem (invited paper), in: A. Fred (eds.), Pattern Recognition in Information Systems (Proc. PRIS2010, Madeira, June 2010), SciTePress, Portugal, 2010, 3-12.

R.P.W. Duin, M. Orozco-Alzate, and J.M. Londono-Bonilla, Classification of volcano events observed by multiple seismic stations, ICPR 2010, 2010, 1052-1055.

R.P.W. Duin and E. Pekalska, Non-Euclidean Dissimilarities: Causes and Informativeness, in: E.R. Hancock et al. (Eds.) (eds.), Proc. SSPR & SPR 2010, Lecture Notes in Computer Science, vol. 6218, Springer, Heidelberg, 2010, 324-333.

P. Paclik, C. Lai, T. Landgrebe, and R.P.W. Duin, ROC analysis and cost- sensitive optimization for hierarchical classifiers, ICPR 2010, 2010, 2977-2980.

N. Sen Koktas and R.P.W. Duin, Statistical Analysis of Gait Data to Assist Clinical Decision Making, Medical Content- Based Retrieval for Clinical Decision Support - MICCAI 2010, Lecture Notes in Computer Science, vol. 5853, Springer, 2010, 61-68.

M. Millan-Giraldo, R.P.W. Duin, and J.S. Sanchez, Dissimilarity-based Classification of Data with Missing Attributes, Proc. The 2nd International IAPR Workshop on Cognitive Information Processing (14-15-16 June, 2010 Elba Island, Tuscany - Italy), IEEE, 2010, 293-298.

M.J. Gangeh, M.S. Kamel, and R.P.W. Duin, Random Subspace Method in Text Categorization, ICPR 2010, 2010, 2049-2052.

L. Sorensen, M. Loog, P. Lo, H. Ashraf, A. Dirksen, R.P.W. Duin, and M. de Bruijne, Image Dissimilarity-Based Quantification of Lung Disease from CT, Medical Image Computing and Computer-Assisted Intervention - MICCAI 2010, Lecture Notes in Computer Science, vol. 6361, Springer, 2010, 37-44.

L. Sorensen, M. Loog, D.M.J. Tax, W.J. Lee, M. de Bruijne, and R.P.W. Duin, Dissimilarity-based Multiple Instance Learning, in: E.R. Hancock et al. (Eds.) (eds.), Proc. SSPR & SPR 2010, Lecture Notes in Computer Science, vol. 6218, Springer, Heidelberg, 2010, 129-138.

D. Porro Munoz, R.P.W. Duin, M. Orozco-Alzate, I. Talavera-Bustamante, and J.M. Londoño-Bonilla, The Dissimilarity Representation as a Tool for Three-way Data Classification: a 2D Measure, in: E.R. Hancock et al. (Eds.) (eds.), Proc. SSPR & SPR 2010, Lecture Notes in Computer Science, vol. 6218, Springer, Heidelberg, 2010.

D. Porro Munoz, R.P.W. Duin, M. Orozco-Alzate, I. Talavera, and J.M. Londono-Bonilla, Classifying Three-way Seismic Volcanic Data by Dissimilarity Representation, ICPR 2010, 2010, 814-817.

A. Ulas, R.P.W. Duin, U. Castellani, M. Loog, M. Bicego, V. Murino, M. Bellani, S. Cerruti, M. Tansella, and P. Brambilla, Dissimilarity-based Detection of Schizophrenia, Proc. ICPR 2010 workshop on Pattern Recognition Challenges in FMRI Neuroimaging, 2010.

A. Ibba, W.-J. Lee, and R.P.W. Duin, Merging multiple sources of information using dissimilarity based approaches, Proc. ASCI 2010, 2010.

A. Ibba, R.P.W. Duin, and W.J. Lee, A study on combining sets of differently measured dissimilarities, ICPR 2010, 2010, 3360-3363.

D. Porro Munoz, R.P.W. Duin, I. Talavera, and N. Hernández, The Representation of Chemical Spectral Data for Classification, The Representation of Chemical Spectral Data for Classification, in: E. Bayro-Corrochano, J.O. Eklundh (eds.), Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications (Proc. CIARP 2009, Guadalajara, Jalisco, Mexico, Nov. 15-18, 2009), Lecture Notes in Computer Science, vol. 5856, Springer, Berlin, 2009, 513-520.

Y. Plasencia-Calana, E. Garcia-Reyes, R.P.W. Duin, H. Mendez-Vazquez, C. San Martin, and C. Soto, Dissimilarity representations for thermal signature recognition at a distance, in: T. Gevers, H. Bos, L. Wolters (eds.), Proc. ASCI 2009, 15th Annual Conf. of the Advanced School for Computing and Imaging (Zeewolde, June 3-5, 2009), 2009.

Y. Plasencia-Calana, E. García-Reyes, R. P. W. Duin, H. Mendez-Vazquez, C. San-Martin, and C. Soto, A Study on Representations for Face Recognition from Thermal Images, in: E. Bayro-Corrochano, J.O. Eklundh (eds.), Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications (Proc. CIARP 2009, Guadalajara, Jalisco, Mexico, Nov. 15-18, 2009), Lecture Notes in Computer Science, vol. 5856, Springer, Berlin, 2009, 185-192.

W.J. Lee and R.P.W. Duin, A Labelled Graph Based Multiple Classifier System, in: J.A. Benediktsson, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 8th Int. Workshop, MCS 2009, Reykjavik, Iceland, June 10-12, 2009), Lecture Notes in Computer Science, vol. 5519, Springer, Berlin, 2009, 201-210.

S.W. Kim and R.P.W. Duin, A Combine- Correct-Combine Scheme for Optimizing Dissimilarity-Based Classifiers, in: E. Bayro-Corrochano, J.O. Eklundh (eds.), Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications (Proc. CIARP 2009, Guadalajara, Jalisco, Mexico, Nov. 15-18, 2009), Lecture Notes in Computer Science, vol. 5856, Springer, Berlin, 2009, 425-432.

M. Bicego, M. Cristani, V. Murino, E. Pekalska, and R.P.W. Duin, Clustering-based construction of Hidden Markov Models for Generative Kernels, Proc. EMMCVPR 2009, 2009.

D. Porro Munoz, R.P.W. Duin, I. Talavera, and N. Hernández, Alternative Representations of Spectral Data for Classification, in: T. Gevers, H. Bos, L. Wolters (eds.), Proc. ASCI 2009, 15th Annual Conf. of the Advanced School for Computing and Imaging (Zeewolde, June 3-5, 2009), 2009.

D.M.J. Tax, M. Loog, and R.P.W. Duin, Optimal Mean-Precision Classifier, in: J.A. Benediktsson, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 8th Int. Workshop, MCS 2009, Reykjavik, Iceland, June 10-12, 2009), Lecture Notes in Computer Science, vol. 5519, Springer, Berlin, 2009, 72-81.

C.X. Zhang and R.P.W. Duin, Investigating the Performance of a Linear Regression Combiner on Multi-class Data Sets, in: T. Gevers, H. Bos, L. Wolters (eds.), Proc. ASCI 2009, 15th Annual Conf. of the Advanced School for Computing and Imaging (Zeewolde, June 3-5, 2009), 2009.

C.X. Zhang and R.P.W. Duin, An Empirical Study of a Linear Regression Combiner on Multi-class Data Sets, in: J.A. Benediktsson, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 8th Int. Workshop, MCS 2009, Reykjavik, Iceland, June 10-12, 2009), Lecture Notes in Computer Science, vol. 5519, Springer, Berlin, 2009, 478-487.

C.V. Dinh, R.P.W. Duin, R. Leitner, and P. Paclik, A Method for Edge Detection in Hyperspectral Images Based on Gradient Clustering, in: T. Gevers, H. Bos, L. Wolters (eds.), Proc. ASCI 2009, 15th Annual Conf. of the Advanced School for Computing and Imaging (Zeewolde, June 3-5, 2009), 2009.

C.V. Dinh, R. Leitner, P. Paclik, and R.P.W. Duin, A Clustering Based Method for Edge Detection in Hyperspectral Images, in: A.B. Salberg, J.Y. Hardeberg, R. Jenssen (eds.), Image Analysis (Proc. 16th Scandinavian Conference, SCIA 2009, Oslo, Norway, June 15-18), Lecture Notes in Computer Science, vol. 5575, Springer, Berlin, 2009, 580-587.

A. Ibba and R.P.W. Duin, A Multiscale Approach in Combining Classifiers in Dissimilarity Representations, in: T. Gevers, H. Bos, L. Wolters (eds.), Proc. ASCI 2009, 15th Annual Conf. of the Advanced School for Computing and Imaging (Zeewolde, June 3-5, 2009), 2009.

W.J. Lee and R.P.W. Duin, An Inexact Graph Comparison Approach in Joint Eigenspace, in: N. da Vitoria Lobo, T. Kasparis, F. Roli, J.T. Kwok, M. Georgiopoulos, G.C. Anagnostopoulos, M. Loog (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2008 (Orlando, Plorida, USA, 4-6 Dec 2008), Lecture Notes in Computer Science, vol. 5342, Springer Verlag, Berlin, 2008, 35-44.

R.P.W. Duin and E. Pekalska, On refining dissimilarity matrices for an improved NN learning, Proc. of the 19th Int. Conf. on Pattern Recognition (ICPR2008, Tampa, USA, December 2008), IEEE Press, 2008.

R.P.W. Duin, E. Pekalska, A. Harol, W.J. Lee, and H. Bunke, On Euclidean corrections for non-Euclidean dissimilarities, in: N. da Vitoria Lobo, T. Kasparis, F. Roli, J.T. Kwok, M. Georgiopoulos, G.C. Anagnostopoulos, M. Loog (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2008 (Orlando, Plorida, USA, 4-6 Dec 2008), Lecture Notes in Computer Science, vol. 5342, Springer Verlag, Berlin, 2008, 551-561.

P. Simeone, R.P.W. Duin, D.M.J. Tax, and F. Tortorella, A Fast Approach to Improve Classification Performance of ECOC Classification Systems, in: N. da Vitoria Lobo, T. Kasparis, F. Roli, J.T. Kwok, M. Georgiopoulos, G.C. Anagnostopoulos, M. Loog (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2008 (Orlando, Plorida, USA, 4-6 Dec 2008), Lecture Notes in Computer Science, vol. 5342, Springer Verlag, Berlin, 2008, 459-468.

P. Paclik, C. Lai, J. Novovicova, and R.P.W. Duin, Variance estimation for two-class and multi-class ROC analysis using operating point averaging, Proc. of the 19th Int. Conf. on Pattern Recognition (ICPR2008, Tampa, USA, December 2008), IEEE Press, 2008.

M. Orozco-Alzate, M. Skurichina, and R.P.W. Duin, Spectral Characterization of Volcanic Earthquakes at Nevado del Ruiz Volcano Using Spectral Band Selection/Extraction Techniques, in: José Ruiz- Shulcloper, Walter G. Kropatsch (eds.), Progress in Pattern Recognition, Image Analysis and Applications, Proceedings of the 13th Iberoamerican Congress on Pattern Recognition, CIARP 2008, Havana, Cuba, September 9-12, 2008., Lecture Notes in Computer Science, vol. 5197, Springer, Berlin, 2008, 708-715.

D.M.J. Tax and R.P.W. Duin, Learning curves for the analysis of multiple instance classifiers, in: N. da Vitoria Lobo, T. Kasparis, F. Roli, J.T. Kwok, M. Georgiopoulos, G.C. Anagnostopoulos, M. Loog (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2008 (Orlando, Plorida, USA, 4-6 Dec 2008), Lecture Notes in Computer Science, vol. 5342, Springer Verlag, Berlin, 2008, 724-733.

Y. Li, D. de Ridder, R.P.W. Duin, and M.J.T. Reinders, An Integrative Kernel Method Dealing With Diverse Measurement Noise in Classification, Proc. ASCI 2007, 13th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, June 13 -15, 2007), 2007, 127-134.

W.J. Lee, S. Verzakov, and R.P.W. Duin, Kernel Combination Versus Classifier Combination, in: M. Haindl, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 7th Int. Workshop, MCS 2007, Prague, May 23-25, 2007), Lecture Notes in Computer Science, vol. 4472, Springer, Berlin, 2007, 22-31.

S.W. Kim and R.P.W. Duin, On Using a Pre- clustering Technique to Optimize LDA-Based Classifiers for Appearance- Based Face Recognition, in: L. Rueda, D. Mery, J. Kittler (eds.), Progress in Pattern Recognition, Image Analysis and Applications, Proceedings of the 12th Iberoamerican Congress on Pattern Recognition, CIARP 2007, Vina del Mar-Valparaiso, Chile, 13-16 November 2007., Lecture Notes in Computer Science, vol. 4756, Springer, Berlin, 2007, 466-476.

S.W. Kim and R.P.W. Duin, On Combining Dissimilarity-Based Classifiers to Solve the Small Sample Size Problem for Appearance-Based Face Recognition, in: Z. Kobti, D. Wu (eds.), Advances in Artificial Intelligence, Proceedings of the 20th Conference of the Canadian Society for Computational Studies of Intelligence, Canadian AI 2007, Montreal, Canada, May 28-30, 2007, Lecture Notes in Computer Science, vol. 4509, Springer, Berlin, 2007, 110-121.

M. Orozco-Alzate, R.P.W. Duin, and C.S. Castellanos-Dominguez, On Selecting Middle-Length Feature Lines for Dissimilarity-based Classification, Proc. XII Simposio de Tratamiento de Senales, Imagenes y Vision Artificial, STSIVA 2007, Colombian Chapter IEEE Signal Processing Society, Barranquilla, Colombia, 2007, 1-6.

M. Orozco-Alzate, R.P.W. Duin, and C.G. Castellanos_Dominguez, Generalizing Dissimilarity Representations Using Feature Lines, in: L. Rueda, D. Mery, J. Kittler (eds.), Progress in Pattern Recognition, Image Analysis and Applications, Proceedings of the 12th Iberoamerican Congress on Pattern Recognition, CIARP 2007, Vina del Mar-Valparaiso, Chile, 13-16 November 2007., Lecture Notes in Computer Science, vol. 4756, Springer, Berlin, 2007, 370-379.

M. Bicego, E. Pekalska, and R.P.W. Duin, Group-induced vector spaces, in: M. Haindl, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 7th Int. Workshop, MCS 2007, Prague, May 23-25, 2007), Lecture Notes in Computer Science, vol. 4472, Springer, Berlin, 2007, 190-199.

T.C.W. Landgrebe and R.P.W. Duin, Combining accuracy and prior sensitivity for cLassifier design under prior uncertainty, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 512-521.

T.C.W. Landgrebe and R.P.W. Duin, A simplified extension of the Area under the ROC to the multiclass domain, in: A. Louw, N. Kleynhans, N. Zulu (eds.), Proceedings of the Seventeenth Annual Symposium of the Pattern Recognition Association of South Africa, PRASA 2006 (Parys, South Africa, 29 Nov. - 1 Dec. 2006), PRASA, Cape Town, SA, 2006, 241-245.

T.C.W. Landgrebe, P. Paclik, R.P.W. Duin, and A.P. Bradley, Precision-recall operating characteristic (P-ROC) curves in imprecise environments, in: Y.Y. Tang, S.P. Wang, G. Lorette, D.S. Yeung, H. Yan (eds.), Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006), vol. 4, IEEE Computer Society Press, Los Alamitos, 2006, 123-126.

S. Verzakov, P. Paclik, and R.P.W. Duin, Statistical pattern recognition approach to edge detection in multichannel images, in: B.P.F. Lelieveldt, B. Haverkort, C.T.A.M. de Laat, J.W.J. Heijnsdijk (eds.), Proc. ASCI 2006, 12th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16, 2006), ASCI, Delft, 2006, 434-439.

S. Verzakov, P. Paclik, and R.P.W. Duin, Edge detection in hyperspectral imaging: multivariate statistical approaches, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 551-559.

R.P.W. Duin and E. Pekalska, Structural inference of sensor-based measurements, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 41-55.

P. Paclik and R.P.W. Duin, A Trainable Similarity Measure for Image Classification, in: Y.Y. Tang, S.P. Wang, G. Lorette, D.S. Yeung, H. Yan (eds.), Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006), vol. 3, IEEE Computer Society Press, Los Alamitos, 2006, 391-394.

P. Juszczak, D.M.J. Tax, S. Verzakov, and R.P.W. Duin, Domain Based LDA and QDA, in: Y.Y. Tang, S.P. Wang, G. Lorette, D.S. Yeung, H. Yan (eds.), Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006), vol. 2, IEEE Computer Society Press, Los Alamitos, 2006, 788-791.

M. Skurichina, S. Verzakov, P. Paclik, and R.P.W. Duin, Effectiveness of Spectral Band Selection/Extraction Techniques for Spectral Data, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 541-550.

M. Orozco-Alzate, M.E. Garcia-Ocampo, R.P.W. Duin, and C.G. Castellanos_Dominguez, Dissimilarity-based classification of seismic signlas at Nevado del Ruiz volcano, Proc. II Latin-American Congress of Seismology (August 8-12 in Bogota, Colombia), 2006, 1-16.

M.J. Gangeh, R.P.W. Duin, C. Eswaran, and B.M. ter Haar Romeny, Scale Space Texture Classification Using Combined Classifiers with Application to Ultrasound Tissue Characterization, in: F. Ibrahim, N.A. Abu Osman, J. Usman, N.A. Kadri (eds.), International Conference on Biomedical Engineering (11-14 December 2006, Kuala Lumpur, Malaysia), Proceedings IFMBE, vol. 15, 2006, 303-306.

E. Pekalska and R.P.W. Duin, Learning with general proximity measures (invited paper), in: A. Fred, A. Lourenco (eds.), Pattern Recognition in Information Systems (Proc. PRIS2006, Paphos, Cyprus, May 2006), INSTICC Press, Portugal, 2006, IS15-IS24.

E. Pekalska and R.P.W. Duin, Dissimilarity-based classification for vectorial representations, in: Y.Y. Tang, S.P. Wang, G. Lorette, D.S. Yeung, H. Yan (eds.), Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006), vol. 3, IEEE Computer Society Press, Los Alamitos, 2006, 137-140.

E. Pekalska, A. Harol, R.P.W. Duin, D. Spillman, and H. Bunke, Non-Euclidean or non- metric measures can be informative, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 871-880.

D. Spillman, M. Neuhaus, H. Bunke, E. Pekalska, and R.P.W. Duin, Transforming Strings to Vector Spaces Using Prototype Selection, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 287-296.

D.M.J. Tax, R.P.W. Duin, and Y. Arzhaeva, Linear model combining by optimizing the Area under the ROC curve, in: Y.Y. Tang, S.P. Wang, G. Lorette, D.S. Yeung, H. Yan (eds.), Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006), vol. 4, IEEE Computer Society Press, Los Alamitos, 2006, 119-122.

D.M.J. Tax, P. Juszczak, E. Pekalska, and R.P.W. Duin, Outlier detection using ball descriptions with adjustable metric, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 587-595.

A. Harol, E. Pekalska, S. Verzakov, and R.P.W. Duin, Augmented embedding of dissimilarity data into (pseudo-)Euclidean spaces, in: D.-Y. Yeung, J.T. Kwok, A. Fred, F. Roli and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006), Lecture Notes in Computer Science, vol. 4109, Springer Verlag, Berlin, 2006, 613-621.

A. Harol, E. Pekalska, S. Verzakov, and R.P.W. Duin, Augmented embedding of dissimilarity data into (pseudo-)Euclidean spaces, in: B.P.F. Lelieveldt, B. Haverkort, C.T.A.M. de Laat, J.W.J. Heijnsdijk (eds.), Proc. ASCI 2006, 12th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16, 2006), ASCI, Delft, 2006, 307-312.

T.C.W. Landgrebe and R.P.W. Duin, On Neyman-Pearson optimisation for multiclass classifiers, in: F. Nicolls (eds.), Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa, PRASA 2005 (Langebaan, South Africa, 23-25 Nov. 2005), PRASA, Cape Town, SA, 2005, 165-170.

T.C.W. Landgrebe, P. Paclik, D.M.J. Tax, and R.P.W. Duin, Optimising two-stage recognition systems, in: N.C. Oza, R. Polikar, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 6th Int. Workshop, MCS 2005, Seaside, CA, USA, June 13-15, 2005), Lecture Notes in Computer Science, vol. 3541, Springer, Berlin, 2005, 206-215.

S. Verzakov and R.P.W. Duin, The Tangent Kernel SVM for Calibration-Stable Histogram Discrimination, in: B.J.A. Krose, H.J. Bos, E.A. Hendriks, J.W.J. Heijnsdijk (eds.), Proc. ASCI 2005, 11th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, June 8-10, 2005), ASCI, Delft, 2005, 73-80.

S. Verzakov, P. Paclik, and R.P.W. Duin, The tangent kernel approach to illumination robust texture classification, in: H. Kalviainen, J. Parkinen, A. Kaarna (eds.), Image Analysis - SCIA 2005 (Proc. 14th Scandinavian Conf. Joensuu, Finland, June 19-July 22), Lecture Notes in Computer Science, vol. 3540, Springer Verlag, Berlin, 2005, 1009-1016.

R.P.W. Duin and E. Pekalska, Open issues in pattern recognition, in: M. Kurzynski, E. Puchala, M. Wozniak, A. Zolnierek (eds.), Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05), Advances in soft computing, Springer Verlag, Berlin, 2005, 27-42.

P. Paclik, T.C.W. Landgrebe, D.M.J. Tax, and R.P.W. Duin, On deriving the second- stage training set for trainable combiners, in: N.C. Oza, R. Polikar, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 6th Int. Workshop, MCS 2005, Seaside, CA, USA, June 13-15, 2005), Lecture Notes in Computer Science, vol. 3541, Springer, Berlin, 2005, 136-146.

P. Paclik, S. Verzakov, and R.P.W. Duin, Improving the maximum- likelihood co-occurrence classifier: a study on classification of inhomogeneous rock images, in: H. Kalviainen, J. Parkinen, A. Kaarna (eds.), Image Analysis - SCIA 2005 (Proc. 14th Scandinavian Conf. Joensuu, Finland, June 19-July 22), Lecture Notes in Computer Science, vol. 3540, Springer Verlag, Berlin, 2005, 998-1008.

P. Paclik and R.P.W. Duin, Designing multi-modal classifiers of spectra: a study on industrial sorting application, in: R. Leitner (eds.), Spectral Imaging (Proc. 2nd Int. Workshop of the Carinthian Tech Research AG, Villach, Austria, Sep 20,2005), Austrian Computer Society, 2005, 19-25.

P. Paclik, D.M.J. Tax, S. Verzakov, and R.P.W. Duin, Simplifying the model- based classifiers for multi-modal problems in classification of spectra., in: F. Nicolls (eds.), Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa, PRASA 2005 (Langebaan, South Africa, 23-25 Nov. 2005), PRASA, Cape Town, SA, 2005, 33-38.

P. Juszczak and R.P.W. Duin, Learning from a test set, in: M. Kurzynski, E. Puchala, M. Wozniak, A. Zolnierek (eds.), Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05), Advances in soft computing, Springer Verlag, Berlin, 2005, 203-210.

M. Skurichina and R.P.W. Duin, Combining feature subsets in feature selection, in: N.C. Oza, R. Polikar, J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. 6th Int. Workshop, MCS 2005, Seaside, CA, USA, June 13-15, 2005), Lecture Notes in Computer Science, vol. 3541, Springer, Berlin, 2005, 165-175.

E. Pekalska and R.P.W. Duin, The use of dissimilarities for object recognition, Proc. EOS Conference on Industrial Image and Machine Vision (Munich, Germany, 13-15 June, 2005), EOS European Optical Society, Hannover, Germany, 2005, 50-53.

E. Pekalska, A. Harol, C. Lai, and R.P.W. Duin, Pairwise selection of features and prototypes, in: M. Kurzynski, E. Puchala, M. Wozniak, A. Zolnierek (eds.), Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05), Advances in soft computing, Springer Verlag, Berlin, 2005, 271-278.

D.M.J. Tax and R.P.W. Duin, Characterizing one-class datasets, in: F. Nicolls (eds.), Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa, PRASA 2005 (Langebaan, South Africa, 23-25 Nov. 2005), PRASA, Cape Town, SA, 2005, 21-26.

A. Harol and R.P.W. Duin, A New Model for Prototype Selection on Distance Data, in: B.J.A. Krose, H.J. Bos, E.A. Hendriks, J.W.J. Heijnsdijk (eds.), Proc. ASCI 2005, 11th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, June 8-10, 2005), ASCI, Delft, 2005, 137-144.

T.C.W. Landgrebe, P. Paclik, D.M.J. Tax, S. Verzakov, and R.P.W. Duin, Cost-based classifier evaluation for imbalanced problems, in: A. Fred, T. Caelli, R.P.W. Duin, A. Campilho, and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2004 (Lisbon, Portugal, August 2004), Lecture Notes in Computer Science, vol. 3138, Springer Verlag, Berlin, 2004, 762-770.

T.C.W. Landgrebe, D.M.J. Tax, P. Paclik, R.P.W. Duin, and C. Andrew, A combining strategy for ill-defined problems, in: F. Nicolls (eds.), Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa (Grabouw, South Africa, 25-26 November 2004), Pattern Recognition Association of South Africa, 2004, 57-62.

S. Verzakov, P. Paclik, and R.P.W. Duin, Feature shaving for spectroscopic data, in: A. Fred, T. Caelli, R.P.W. Duin, A. Campilho, and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2004 (Lisbon, Portugal, August 2004), Lecture Notes in Computer Science, vol. 3138, Springer Verlag, Berlin, 2004, 1026-1033.

S. Verzakov, P. Paclik, and R.P.W. Duin, Exploiting connectivity in spectral data: SVM band-shaving, in: J.J. van Wijk, J.W.J. Heijnsdijk, K.G. Langendoen, R. Veltkamp (eds.), Proc. ASCI 2004, 10th Annual Conf. of the Advanced School for Computing and Imaging (Ouddorp, NL, June 2-4), ASCI, Delft, 2004, 129-134.

R.P.W. Duin, E. Pekalska, P. Paclik, and D.M.J. Tax, The dissimilarity representation, a basis for domain based pattern recognition?, in: L. Goldfarb (eds.), Pattern representation and the future of pattern recognition, a program for action (ICPR 2004 Workshop Proceedings, Cambridge UK, 22 August 2004), Faculty of Computer Science, Univ. of New Brunswick, Fredericton, NB, Canada, 2004, 43-56.

R.P.W. Duin, E. Pekalska, and D.M.J. Tax, The characterization of classification problems by classifier disagreements, in: J. Kittler, M. Petrou, M. Nixon (eds.), Proceedings 17th International Conference on Pattern Recognition (22-26 August 2004, Cambridge UK), vol. 1, IEEE Computer Society, Los Alamitos, CA, 2004, 140-143.

P. Paclik, S. Verzakov, and R.P.W. Duin, Multi-class extensions of the GLDB feature extraction algorithm for spectral data, in: J. Kittler, M. Petrou, M. Nixon (eds.), Proceedings 17th International Conference on Pattern Recognition (22-26 August 2004, Cambridge UK), vol. 4, IEEE Computer Society, Los Alamitos, CA, 2004, 629-632.

P. Juszczak and R.P.W. Duin, Selective sampling based on the variation in label assignments, in: J. Kittler, M. Petrou, M. Nixon (eds.), Proceedings 17th International Conference on Pattern Recognition (22-26 August 2004, Cambridge UK), vol. 3, IEEE Computer Society, Los Alamitos, CA, 2004, 375-378.

P. Juszczak and R.P.W. Duin, Combining one-class classifiers to handle missing data, in: J.J. van Wijk, J.W.J. Heijnsdijk, K.G. Langendoen, R. Veltkamp (eds.), Proc. ASCI 2004, 10th Annual Conf. of the Advanced School for Computing and Imaging (Ouddorp, NL, June 2-4), ASCI, Delft, 2004, 75-82.

P. Juszczak and R.P.W. Duin, Combining one-class classifiers to classify missing data, in: F. Roli, J. Kittler, T, Windeatt (eds.), Multiple Classifier Systems, Proceedings Fifth International Workshop MCS 2004 (Cagliari, Italy, June 2004), Lecture Notes in Computer Science, vol. 3077, Springer Verlag, Berlin, 2004, 92-101.

M. Skurichina, P. Paclik, R.P.W. Duin, D.C.G. de Veld, H.J.C.M. Sterenborg, M.J.H. Witjes, and J.L.N. Roodenburg, Selection/Extraction of Spectral Regions for Autofluorescence Spectra Measured in the Oral Cavity, in: A. Fred, T. Caelli, R.P.W. Duin, A. Campilho, and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2004 (Lisbon, Portugal, August 2004), Lecture Notes in Computer Science, vol. 3138, Springer Verlag, Berlin, 2004, 1096-1104.

M. Loog, R.P.W. Duin, and B. van Ginneken, Dimensionality Reduction by the Canonical Contextual Correlation Projection, in: T. Pajdla, J. Matas (eds.), Computer Vision - ECCV 2004, 8th European Conference on Computer Vision (Prague, Czech Republic, May 11-14, 2004), Lecture Notes in Computer Science, vol. 3021, Springer, Berlin, 2004, 562-573.

E. Pekalska, R.P.W. Duin, S. Gunter, and H. Bunke, On not making dissimilarities Euclidean, in: A. Fred, T. Caelli, R.P.W. Duin, A. Campilho, and D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2004 (Lisbon, Portugal, August 2004), Lecture Notes in Computer Science, vol. 3138, Springer Verlag, Berlin, 2004, 1145-1154.

E. Pekalska, M. Skurichina, and R.P.W. Duin, Combining Dissimilarity Representations in One-class Classifier Problems, in: F. Roli, J. Kittler, T, Windeatt (eds.), Multiple Classifier Systems, Proceedings Fifth International Workshop MCS 2004 (Cagliari, Italy, June 2004), Lecture Notes in Computer Science, vol. 3077, Springer Verlag, Berlin, 2004, 122-133.

P. Paclik and R.P.W. Duin, Classifying spectral data using relational representations, in: R. Leitner (eds.), Spectral Imaging (Proc. Int. Workshop of the Carinthian Tech Research AG, Graz, Austria, April 3), Austrian Computer Society, Vienna, 2003, 31-34.

P. Juszczak and R.P.W. Duin, Uncertainty sampling for one-class classifiers, in: N. Chawla, N. Japkowicz, A. Kolcz (eds.), Proc. of the ICML-2003 Workshop: "Learning with Imbalanced Data Sets II" (Washington D.C., Aug.21), ICML2003, Washington D.C., 2003, 81-88.

P. Juszczak and R.P.W. Duin, Selective Sampling Methods in One-Class Classification Problems, in: O. Kaynak, E. Alpaydin, E. Oja, L. Xu (eds.), Artificial Neural Networks and Neural Information Processing (Proc. Joint Int. Conf. ICANN/ICONIP 2003, Istanbul, Turkey, June 26-29), Lecture Notes in Computer Science, vol. 2714, Springer Verlag, Berlin, 2003, 140-148.

P. Juszczak and R.P.W. Duin, How to ask an expert for new samples in the one-class classification problem?, in: S. Vassiliades, L.M.J. Florack, J.W.J. Heijnsdijk, A. van der Steen (eds.), Proc. ASCI 2003, 9th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, June 4-6), ASCI, Delft, 2003, 225-231.

M. Skurichina and R.P.W. Duin, Combining Different Normalizations in Lesion Diagnostics, in: O. Kaynak, E. Alpaydin, E. Oja, L. Xu (eds.), Artificial Neural Networks and Neural Information Processing (Proc. Joint Int. Conf. ICANN/ICONIP 2003, Istanbul, Turkey, June 26-29), ICANN/ICONIP, Istanbul, Turkey, 2003, 227-230.

E. Pekalska, D.M.J. Tax, and R.P.W. Duin, One-Class LP Classifiers for Dissimilarity Representations, in: S. Becker, S. Thrun and K. Obermayer (eds.), Advances in Neural Information Processing Systems, vol. 15 (Proc. NIPS 2002, Vancouver, Dec.9-12, 2002), MIT Press, Cambridge, MA, 2003, 761-768.

D. de Ridder, O. Kouropteva, O. Okun, M. Pietikainen, and R.P.W. Duin, Supervised Locally Linear Embedding, in: O. Kaynak, E. Alpaydin, E. Oja, L. Xu (eds.), Artificial Neural Networks and Neural Information Processing (Proc. Joint Int. Conf. ICANN/ICONIP 2003, Istanbul, Turkey, June 26-29), Lecture Notes in Computer Science, vol. 2714, Springer Verlag, Berlin, 2003, 333-341.

C. Lai, D.M.J. Tax, R.P.W. Duin, E. Pekalska, and P. Paclik, Database retrieval: the use of combined dissimilaities, in: S. Vassiliades, L.M.J. Florack, J.W.J. Heijnsdijk, A. van der Steen (eds.), Proc. ASCI 2003, 9th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, June 4-6), ASCI, Delft, 2003, 177-184.

R.P.W. Duin, The Combining Classifier: To Train Or Not To Train?, in: R. Kasturi, D. Laurendeau, C. Suen (eds.), ICPR16, Proceedings 16th International Conference on Pattern Recognition (Quebec City, Canada, Aug.11-15), vol. II, IEEE Computer Society Press, Los Alamitos, 2002, 765-770.

R.P.W. Duin and E. Pekalska, Possibilities of zero- error recognition by dissimilarity representations, in: J.M. Inesta, L. Mico (eds.), Pattern Recognition in Information Systems (Proc. PRIS2002, Alicante, April 2002), ICEIS Press, Setubal, Portugal, 2002, 20-32.

P. Paclik, R.P.W. Duin, G.M.P. van Kempen, and R. Kohlus, Supervised Segmentation of Textures in Backscatter Images, in: R. Kasturi, D. Laurendeau, C. Suen (eds.), ICPR16, Proceedings 16th International Conference on Pattern Recognition (Quebec City, Canada, Aug.11-15), vol. II, IEEE Computer Society Press, Los Alamitos, 2002, 490-493.

P. Paclik, R.P.W. Duin, G.M.P. van Kempen, and R. Kohlus, On feature selection with measurement cost and grouped features, in: T. Caelli, A. Amin, R.P.W. Duin, M. Kamel, D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. Joint IAPR International Workshops SSPR'02 and SPR'02 (Windsor, Canada, Aug.6-9), Lecture Notes in Computer Science, vol. 2396, Springer Verlag, Berlin, 2002, 443-451.

P. Juszczak, D.M.J. Tax, and R.P.W. Duin, Feature scaling in support vector data description, in: E.F. Deprettere, A. Belloum, J.W.J. Heijnsdijk, F. van der Stappen (eds.), Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging (Lochem, NL, June 19-21), ASCI, Delft, 2002, 95-102.

M. Skurichina, L.I. Kuncheva, and R.P.W. Duin, Bagging and Boosting for the Nearest Mean Classifier: Effects of Sample Size on Diversity and Accuracy, in: F. Roli, J. Kittler (eds.), Multiple Classifier Systems, Proceedings Third International Workshop MCS 2002 (Cagliari, Italy, June 24-26), Lecture Notes in Computer Science, vol. 2364, Springer Verlag, Berlin, 2002, 62-71.

M. Loog and R.P.W. Duin, Non-iterative heteroscedastic linear dimension reduction for two-class data; from Fisher to Chernoff, in: T. Caelli, A. Amin, R.P.W. Duin, M. Kamel, D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. Joint IAPR International Workshops SSPR'02 and SPR'02 (Windsor, Canada, Aug.6-9), Lecture Notes in Computer Science, vol. 2396, Springer Verlag, Berlin, 2002, 488-496.

E. Pekalska and R.P.W. Duin, Spatial representation of dissimilarity data via lower-complexity linear and nonlinear mappings, in: T. Caelli, A. Amin, R.P.W. Duin, M. Kamel, D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. Joint IAPR International Workshops SSPR'02 and SPR'02 (Windsor, Canada, Aug.6-9), Lecture Notes in Computer Science, vol. 2396, Springer Verlag, Berlin, 2002, 470-478.

E. Pekalska and R.P.W. Duin, Prototype Selection for Finding Efficient Representations of Dissimilarity Data, in: R. Kasturi, D. Laurendeau, C. Suen (eds.), ICPR16, Proceedings 16th International Conference on Pattern Recognition (Quebec City, Canada, Aug.11-15), vol. III, IEEE Computer Society Press, Los Alamitos, 2002, 37-40.

E. Pekalska, R.P.W. Duin, and M. Skurichina, A discussion on the classifier projection space for classifier combining, in: F. Roli, J. Kittler (eds.), Multiple Classifier Systems, Proceedings Third International Workshop MCS 2002 (Cagliari, Italy, June 24-26), Lecture Notes in Computer Science, vol. 2364, Springer Verlag, Berlin, 2002, 137-148.

D.M.J. Tax and R.P.W. Duin, Using Two-Class Classifiers for Multiclass Classification, in: R. Kasturi, D. Laurendeau, C. Suen (eds.), ICPR16, Proceedings 16th International Conference on Pattern Recognition (Quebec City, Canada, Aug.11-15), vol. II, IEEE Computer Society Press, Los Alamitos, 2002, 124-127.

D. de Ridder, R.P.W. Duin, and J. Kittler, Texture description by independent components, in: T. Caelli, A. Amin, R.P.W. Duin, M. Kamel, D. de Ridder (eds.), Structural, Syntactic, and Statistical Pattern Recognition, Proc. Joint IAPR International Workshops SSPR'02 and SPR'02 (Windsor, Canada, Aug.6-9), Lecture Notes in Computer Science, vol. 2396, Springer Verlag, Berlin, 2002, 587-596.

D. de Ridder, R.P.W. Duin, and J. Kittler, Texture description by independent components, in: E.F. Deprettere, A. Belloum, J.W.J. Heijnsdijk, F. van der Stappen (eds.), Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging (Lochem, NL, June 19-21), ASCI, Delft, 2002, 163-169.

D. de Ridder, E. Pekalska, and R.P.W. Duin, The Economics of Classification: Error vs. Complexity, in: R. Kasturi, D. Laurendeau, C. Suen (eds.), ICPR16, Proceedings 16th International Conference on Pattern Recognition (Quebec City, Canada, Aug.11-15), vol. II, IEEE Computer Society Press, Los Alamitos, 2002, 244-247.

C. Lai, D.M.J. Tax, R.P.W. Duin, E. Pekalska, and P. Paclik, On combining one-class classifiers for image database retrieval, in: F. Roli, J. Kittler (eds.), Multiple Classifier Systems, Proceedings Third International Workshop MCS 2002 (Cagliari, Italy, June 24-26), Lecture Notes in Computer Science, vol. 2364, Springer Verlag, Berlin, 2002, 212-221.

R.P.W. Duin, Four Scientific Approaches to Pattern Recognition, in: A.M. Vossepoel, F.M. Vos (eds.), Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 2001, 331-337.

R.P.W. Duin and E. Pekalska, Complexity of Dissimilarity based Pattern Classes, in: I. Austvoll (eds.), Proceedings of the 12th Scandinavian Conference on Image Analysis, SCIA 2001 (Bergen, Norway, June 11-14), NOBIM, Stavanger, Norway, 2001, 663-670.

P. Paclik, R.P.W. Duin, and G.M.P. van Kempen, Segmentation of multi- spectral images using a combined classifier approach, in: R.L. Lagendijk, J.W.J. Heijnsdijk, A.D. Pimentel, M.H.F. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 147-153.

P. Paclik, R.P.W. Duin, and G.M.P. van Kempen, Multi-spectral Image Segmentation Algorithm Combining Spatial and Spectral Information, in: I. Austvoll (eds.), Proceedings of the 12th Scandinavian Conference on Image Analysis, SCIA 2001 (Bergen, Norway, June 11-14), NOBIM, Stavanger, Norway, 2001, 230-235.

M. Skurichina and R.P.W. Duin, Bagging and the Random Subspace Method for Redundant Feature Spaces, in: J. Kittler, F. Roli (eds.), Multiple Classifier Systems, Proceedings Second International Workshop MCS 2001 (Cambridge, UK, July), Lecture Notes in Computer Science, vol. 2096, Springer Verlag, Berlin, 2001, 1-10.

M.E.M. Musa, R.P.W. Duin, and D. de Ridder, Modelling Handwritten Digit Data using Probabilistic Principal Component Analysis, in: R.L. Lagendijk, J.W.J. Heijnsdijk, A.D. Pimentel, M.H.F. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 415-421.

M.E.M. Musa, R.P.W. Duin, and D. de Ridder, An Enhanced EM Algorithm for Principal Component Analyzers, in: A. Leonardis, H. Bischof (eds.), Proc. ICANN 2001 Workshop on Kernel and Subspace Methods for Computer Vision (Vienna, Aug.25), 2001, 25-35.

E. Pekalska and R.P.W. Duin, On Combining Dissimilarity Representations, in: J. Kittler, F. Roli (eds.), Multiple Classifier Systems, Proceedings Second International Workshop MCS 2001 (Cambridge, UK, July), Lecture Notes in Computer Science, vol. 2096, Springer Verlag, Berlin, 2001, 359-368.

E. Pekalska and R.P.W. Duin, Is combining useful for dissimilarity representations?, in: R.L. Lagendijk, J.W.J. Heijnsdijk, A.D. Pimentel, M.H.F. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 154-161.

D.M.J. Tax and R.P.W. Duin, Outliers and data descriptions, in: R.L. Lagendijk, J.W.J. Heijnsdijk, A.D. Pimentel, M.H.F. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 234-241.

D.M.J. Tax and R.P.W. Duin, Combining One-Class Classifiers, in: J. Kittler, F. Roli (eds.), Multiple Classifier Systems, Proceedings Second International Workshop MCS 2001 (Cambridge, UK, July), Lecture Notes in Computer Science, vol. 2096, Springer Verlag, Berlin, 2001, 299-308.

D. de Ridder, O. Lemmers, R.P.W. Duin, and J. Kittler, The Adaptive Subspace Map for Image Description and Image Database Retrieval (reprint), in: A.M. Vossepoel, F.M. Vos (eds.), Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 2001, 291-299.

A. Ypma, R. J. Kleiman, J. Valk, and R.P.W. Duin, MONISOM - a system for machine health monitoring with neural networks, 13th Belgian-Dutch Conference on AI - BNAIC'01 (Amsterdam, Oct.25-26), 2001, 495-496.

A. Ypma, O. Speekenbrink, and R.P.W. Duin, The use of context in dynamic pattern recognition applications, 13th Belgian-Dutch Conference on AI - BNAIC'01 (Amsterdam, Oct.25-26), 2001, 307-314.

A. Ypma, O. Baunbaek-Jensen, C. Melissant, and R.P.W. Duin, Health monitoring with learning methods, in: H. Bischof, K. Hornik (eds.), ICANN'01, Int. Conf. on Artificial Neural Networks (Vienna, Aug.22-24), 2001, 541-546.

A.K. Jain, R.P.W. Duin, and J. Mao, Statistical Pattern Recognition: A Review (reprint), in: A.M. Vossepoel, F.M. Vos (eds.), Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 2001, 1-34.

R.P.W. Duin, Learned from Neural Networks (Theme Presentation), in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 9-13.

R.P.W. Duin, Classifiers in Almost Empty Spaces, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, A.K. Jain, J. Kittler (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 2, Pattern Recognition and Neural Networks, IEEE Computer Society Press, Los Alamitos, 2000, 1-7.

R.P.W. Duin, M. Loog, and R. Haeb-Umbach, Multi-class Linear Feature Extraction by Nonlinear PCA, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, A.K. Jain, J. Kittler (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 2, Pattern Recognition and Neural Networks, IEEE Computer Society Press, Los Alamitos, 2000, 398-401.

R.P.W. Duin and D.M.J. Tax, Experiments with Classifier Combining Rules (invited paper), in: J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. First International Workshop, MCS 2000, Cagliari, Italy, June 2000), Lecture Notes in Computer Science, vol. 1857, Springer, Berlin, 2000, 16-29.

M. Skurichina and R.P.W. Duin, The Role of Combining Rules in Bagging and Boosting, in: F.J. Ferri, J.M. Inesta, A. Amin, P. Pudil (eds.), Advances in Pattern Recognition, Proc. Joint IAPR International Workshops SSPR2000 and SPR2000 (Alicante, Spain, August/September 2000), Lecture Notes in Computer Science, vol. 1876, Springer Verlag, Berlin, 2000, 631-640.

M. Skurichina and R.P.W. Duin, Boosting in Linear Discriminant Analysis, in: J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. First International Workshop, MCS 2000, Cagliari, Italy, June 2000), Lecture Notes in Computer Science, vol. 1857, Springer, Berlin, 2000, 190-199.

M. Skurichina, A. Ypma, and R.P.W. Duin, The Role of Subclasses in Machine Diagnostics, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, A.K. Jain, J. Kittler (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 2, Pattern Recognition and Neural Networks, IEEE Computer Society Press, Los Alamitos, 2000, 668-671.

L.I. Kuncheva, C.J. Whitaker, C.A. Shipp, and R.P.W. Duin, Is Independence Good For Combining Classifiers?, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, A.K. Jain, J. Kittler (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 2, Pattern Recognition and Neural Networks, IEEE Computer Society Press, Los Alamitos, 2000, 168-171.

E. Pekalska and R.P.W. Duin, Classifiers for dissimilarity-based pattern recognition, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, A.K. Jain, J. Kittler (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 2, Pattern Recognition and Neural Networks, IEEE Computer Society Press, Los Alamitos, 2000, 12-16.

E. Pekalska and R.P.W. Duin, Classification on dissimilarity data: a first look, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 221-228.

E. Pekalska, M. Skurichina, and R.P.W. Duin, Combining Fisher Linear Discriminants for Dissimilarity Representations, in: J. Kittler, F. Roli (eds.), Multiple Classifier Systems (Proc. First International Workshop, MCS 2000, Cagliari, Italy, June 2000), Lecture Notes in Computer Science, vol. 1857, Springer, Berlin, 2000, 117-126.

D.M.J. Tax and R.P.W. Duin, Data Description in Subspaces, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, A.K. Jain, J. Kittler (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 2, Pattern Recognition and Neural Networks, IEEE Computer Society Press, Los Alamitos, 2000, 672-675.

D.M.J. Tax, R.P.W. Duin, and K. Messer, Image Database Retrieval with Support Vector Data Descriptions, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 134-140.

D. de Ridder, O. Lemmers, R.P.W. Duin, and J. Kittler, The Adaptive Subspace Map for Image Description and Image Database Retrieval, in: F.J. Ferri, J.M. Inesta, A. Amin, P. Pudil (eds.), Advances in Pattern Recognition, Proc. Joint IAPR International Workshops SSPR2000 and SPR2000 (Alicante, Spain, August/September 2000), Lecture Notes in Computer Science, vol. 1876, Springer Verlag, Berlin, 2000, 94-103.

D. de Ridder, O. Lemmers, R.P.W. Duin, and J. Kittler, Image database retrieval using adaptive non-linear image descriptions, in: L.J. van Vliet, J.W.J. Heijnsdijk, T. Kielman, P.M.W. Knijnenburg (eds.), Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16), ASCI, Delft, 2000, 145-152.

D. de Ridder, J. Kittler, and R.P.W. Duin, Probabilistic PCA and ICA subspace mixture models for image segmentation, in: M. Mirmehdi, B. Thomas (eds.), Proceedings British Machine Vision Conference 2000, vol. 1, BMVA, 2000, 112-121.

D. de Ridder, J. Kittler, O. Lemmers, and R.P.W. Duin, The adaptive subspace map for texture segmentation, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, J.-O. Eklundh, Y. Aloimonos (eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), vol. 1, Computer Vision and Image Analysis, IEEE Computer Society Press, Los Alamitos, 2000, 216-220.

R.P.W. Duin, Compactness and Complexity of Pattern Recognition Problems, in: C. Perneel (eds.), Proc. Int. Symposium on Pattern Recognition "In Memoriam Pierre Devijver" (Brussels, B, Feb.12), Royal Military Academy, Brussels, 1999, 124-128.

P.P. Jonker, R.P.W. Duin, D. de Ridder, R. Ligteringen, and D.M.J. Tax, Technological challenges in defect detection for metal strip; pattern recognition algorithms, in: S. Kaiser, G. Qing (eds.), The 1st Sino- European Symposium on Quality Control of High-Grade Steel, University of Science and Technology Beijing, Beijing, 1999, 38-40.

J. Dijk, D. de Ridder, P.W. Verbeek, J. Walraven, I.T. Young, R.P.W. Duin, and L.J. van Vliet, A new measure for the effect of sharpening and smoothing filters on images, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 213-220.

E. van der Werf and R.P.W. Duin, Improved image segmentation by training non-linear diabolo networks, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 229-234.

E. Pekalska, D. de Ridder, R.P.W. Duin, and M.A. Kraaijveld, A new method of generalizing Sammon mapping with application to algorithm speed-up, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 221-228.

D.M.J. Tax and R.P.W. Duin, Data domain description using support vectors, in: M. Verleysen (eds.), Proc. European Symposium on Artificial Neural Networks (Bruges, April 21-23, 1999), D-Facto, Brussels, 1999, 251-257.

D.M.J. Tax, A. Ypma, and R.P.W. Duin, Support vector data description applied to machine vibration analysis, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 398-405.

D.M.J. Tax, A. Ypma, and R.P.W. Duin, Pump failure detection using support vector data descriptions, in: D.J. Hand, J.N. Kok, M.R. Berthold (eds.), Advances in Intelligent Data Analysis (Proc. IDA-99, 3rd Int. Symposium, Amsterdam, August 9-11), Lecture Notes in Computer Science, vol. 1642, Springer Verlag, Berlin, 1999, 415-425.

D. de Ridder, R.P.W. Duin, P.W. Verbeek, and L.J. van Vliet, A weight set decorrelating algorithm for neural network interpretation and symmetry breaking, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 739-746.

A. Ypma, D.M.J. Tax, and R.P.W. Duin, Robust machine fault detection with Independent Component Analysis and Support Vector Data Description, in: Y.H. Hu, J. Larsen, E. Wilson, S. Douglas (eds.), Neural Networks for Signal Processing IX (Proc. of the 1999 IEEE Workshop, Madison), IEEE, New York, 1999, 67-76.

R.P.W. Duin, Relational Discriminant Analysis and Its Large Sample Size Problem, in: A.K. Jain, S. Venkatesh, B.C. Lovell (eds.), ICPR'98, Proc. 14th Int. Conference on Pattern Recognition (Brisbane, Aug. 16-20), IEEE Computer Society Press, Los Alamitos, 1998, 445-449.

R.P.W. Duin and D.M.J. Tax, Classifier conditional posterior probabilities, in: A. Amin, D. Dori, P. Pudil, H. Freeman (eds.), Advances in Pattern Recognition, Proc. Joint IAPR Int. Workshops SSPR'98 and SPR'98 (Sydney, Australia, August 1998), Lecture Notes in Computer Science, vol. 1451, Springer, Berlin, 1998, 611-619.

M. van Breukelen and R.P.W. Duin, Neural Network Initialization by Combined Classifiers, in: A.K. Jain, S. Venkatesh, B.C. Lovell (eds.), ICPR'98, Proc. 14th Int. Conference on Pattern Recognition (Brisbane, Aug. 16-20), IEEE Computer Society Press, Los Alamitos, 1998, 215-218.

M. Skurichina and R.P.W. Duin, Regularization by adding redundant features, in: A. Amin, D. Dori, P. Pudil, H. Freeman (eds.), Advances in Pattern Recognition, Proc. Joint IAPR Int. Workshops SSPR'98 and SPR'98 (Sydney, Australia, August 1998), Lecture Notes in Computer Science, vol. 1451, Springer, Berlin, 1998, 564-572.

D.M.J. Tax and R.P.W. Duin, Outlier detection using classifier instability, in: A. Amin, D. Dori, P. Pudil, H. Freeman (eds.), Advances in Pattern Recognition, Proc. Joint IAPR Int. Workshops SSPR'98 and SPR'98 (Sydney, Australia, August 1998), Lecture Notes in Computer Science, vol. 1451, Springer, Berlin, 1998, 593-601.

D. de Ridder, R.P.W. Duin, P.W. Verbeek, and L.J. van Vliet, On the application of neural networks to non-linear image processing tasks, in: S. Usui, T. Omori (eds.), ICONIP'98, Proc. Int. Conf. on Neural Information Processing Systems 1998 (Kitakyushu, Japan, Oct.21-23) Vol.1, IOS Press, Tokyo, 1998, 161-165.

D. de Ridder, D.M.J. Tax, and R.P.W. Duin, An experimental comparison of one-class classification methods, in: B.M.ter Haar Romeny, D.H.J. Epema, J.F.M. Tonino, A.A. Wolters (eds.), Proc. ASCI'98, 4th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 9-11), ASCI, Delft, 1998, 213-218.

A. Ypma and R.P.W. Duin, Support objects for domain approximation, in: L. Niklasson, M. Boden, T. Ziemke (eds.), ICANN'98, Proceedings of the 8th International Conference on Artificial Neural Networks (Skovde, Sweden, 2-4 September 1998), Springer, Berlin, 1998, 719-724.

A. Ypma, E. Pekalska, and R.P.W. Duin, Domain approximation for condition monitoring, in: B.M.ter Haar Romeny, D.H.J. Epema, J.F.M. Tonino, A.A. Wolters (eds.), Proc. ASCI'98, 4th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 9-11), ASCI, Delft, 1998, 257-263.

R.P.W. Duin and D. de Ridder, Neural network experiences between perceptrons and support vectors (invited paper), in: A.F. Clark (eds.), Proc. of the 8th British Machine Vision Conference, volume 2 (Colchester, UK, Sep.8-11), University of Essex, Colchester, UK, 1997, 590-599.

R.P.W. Duin, D. de Ridder, and D.M.J. Tax, Featureless Classification (invited paper), in: P. Pudil, J. Novovicova, J. Grim (eds.), Proc. 1st International Workshop Statistical Techniques in Pattern Recognition (Prague, CR, June 9-11), Inst. of Inf. Theory and Automation, Academy of Sciences of the Czech Republic, Prague, 1997, 37-42.

R. Ligteringen, R.P.W. Duin, E.E.E. Frietman, and A. Ypma, Machine diagnostics by neural networks, Experimental setup, in: H.E. Bal, H. Corporaal, P.P. Jonker, J.F.M. Tonino (eds.), ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 2-4), ASCI, Delft, 1997, 185-190.

M. van Breukelen, R.P.W. Duin, D.M.J. Tax, and J.E. den Hartog, Combining classifiers for the recognition of handwritten digits, in: P. Pudil, J. Novovicova, J. Grim (eds.), Proc. 1st International Workshop Statistical Techniques in Pattern Recognition (Prague, CR, June 9-11), Inst. of Inf. Theory and Automation, Academy of Sciences of the Czech Republic, Prague, 1997, 13-18.

M. Skurichina and R.P.W. Duin, Scale dependence of noise injection in perceptron training, in: P. Pudil, J. Novovicova, J. Grim (eds.), Proc. 1st International Workshop Statistical Techniques in Pattern Recognition (Prague, CR, June 9-11), Inst. of Inf. Theory and Automation, Academy of Sciences of the Czech Republic, Prague, 1997, 153-158.

D.M.J. Tax, R.P.W. Duin, and M. van Breukelen, Comparison between product and mean classifier combination rules, in: P. Pudil, J. Novovicova, J. Grim (eds.), Proc. 1st International Workshop Statistical Techniques in Pattern Recognition (Prague, CR, June 9-11), Inst. of Inf. Theory and Automation, Academy of Sciences of the Czech Republic, Prague, 1997, 165-170.

D.M.J. Tax, D. de Ridder, and R.P.W. Duin, Support vector classifiers: A first look, in: H.E. Bal, H. Corporaal, P.P. Jonker, J.F.M. Tonino (eds.), ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 2-4), ASCI, Delft, 1997, 253-258.

A. Ypma and R.P.W. Duin, Using the wavenet for function approximation, in: H.E. Bal, H. Corporaal, P.P. Jonker, J.F.M. Tonino (eds.), ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 2-4), ASCI, Delft, 1997, 236-240.

A. Ypma, R. Ligteringen, E.E.E. Frietman, and R.P.W. Duin, Recognition of bearing failures using wavelets and neural networks, 2nd UK Symposium on Applications of Time-Frequency and Time-Scale Methods (Coventry, Aug.27-29), University of Warwick, Coventry, UK, 1997, 69-72.

A. Hoekstra and R.P.W. Duin, Neuron clustering in feed forward neural networks, in: H.E. Bal, H. Corporaal, P.P. Jonker, J.F.M. Tonino (eds.), ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 2-4), ASCI, Delft, 1997, 162-166.

Z. Shaaban, G. Sulong, and R.P.W. Duin, Symbol recognition based on distance transform, Proc. IASTED Int. Conf. Signal and Image Processing and Applications (Annecy, France, June 12-14), 1996, 225-230.

Z. Shaaban, G. Sulong, and R.P.W. Duin, Recognition of uppercase handwritten characters using multiple neural networks, Proc. ROVPIA'96, Int. Conf. on Robotics Vision and Parallel Processing for Industrial Automation (Ipoh, Perak, Malaysia, November 28-30), Universiti Sains Malaysia, Perak, Malaysia, 1996, 927-934.

Z. Shaaban, G. Sulong, and R.P.W. Duin, Recognition of handprinted characters using distance transform and moment invariants via parallel neural networks, Proceedings of ICECS'95 International conference on electronics, circuits and systems '95, (Amman-Jordan, 1995), 1996, 393-398.

W.F. Schmidt and R.P.W. Duin, On comparing neural network classifiers, in: J.A.C. Bernsen, J.J. Gerbrands, A.A. Hoeve, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Third Quinquennial Review 1991-1996 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 1996, 289-300.

R.P.W. Duin, Trends in linear and nonlinear pattern recognition, in: J.A.C. Bernsen, J.J. Gerbrands, A.A. Hoeve, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Third Quinquennial Review 1991-1996 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 1996, 1-2.

R.P.W. Duin, The influence of spatial pixel relations on the image recognition performance, Proc. ASCI'96, 2nd Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 5-7), ASCI, Delft, 1996, 248-252.

R.P.W. Duin, Superlearning capabilities of neural networks? (reprint), in: J.A.C. Bernsen, J.J. Gerbrands, A.A. Hoeve, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Third Quinquennial Review 1991-1996 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 1996, 119-126.

R.P.W. Duin, Nonlinear data mapping by neural networks, in: Vandoni, C.E. (eds.), Proc. 1996 CERN School of Computing (Egmond aan Zee, Sep.8-21), vol. 96-08, CERN, Geneve, 1996, 11-15.

R.D.T. Janssen, R.P.W. Duin, and A.M. Vossepoel, Evaluation method for an automatic map interpretation system for cadastral maps (reprint), in: J.A.C. Bernsen, J.J. Gerbrands, A.A. Hoeve, A.W.M. Smeulders, M.A. Viergever, A.M. Vossepoel (eds.), Third Quinquennial Review 1991-1996 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 1996, 243-246.

M. Skurichina and R.P.W. Duin, Stabilizing classifiers for very small sample sizes, ICPR13, Proc. 13th Int. Conf. on Pattern Recognition (Vienna, Austria, Aug.25-29) Vol. 2, Track B: Pattern Recognition and Signal Analysis, IEEE Computer Society Press, Los Alamitos, 1996, 891-896.

J. Kittler, M. Hatef, and R.P.W. Duin, Combining classifiers, ICPR13, Proc. 13th Int. Conf. on Pattern Recognition (Vienna, Austria, Aug.25-29) Vol. 2, Track B: Pattern Recognition and Signal Analysis, IEEE Computer Society Press, Los Alamitos, 1996, 897-901.

D. de Ridder, A. Hoekstra, and R.P.W. Duin, Feature extraction in shared weights neural networks, Proc. ASCI'96, 2nd Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 5-7), ASCI, Delft, 1996, 289-294.

A. Hoekstra, S.A. Tholen, and R.P.W. Duin, Estimating the reliability of neural network classifications, in: C. von der Malsburg, W. von Seelen, J.C. Vorbruggen, B. Sendhoff (eds.), Artificial Neural Networks - ICANN96 Proceedings of the 1996 Int. Conf. (Bochum, Germany, July 16-19), Lecture Notes in Computer Science, vol. 1112, Springer-Verlag, Berlin, 1996, 53-58.

A. Hoekstra and R.P.W. Duin, On the nonlinearity of pattern classifiers, ICPR13, Proc. 13th Int. Conf. on Pattern Recognition (Vienna, Austria, Aug.25-29) Vol. 4, Track D: Parallel and Connectionist Systems, IEEE Computer Society Press, Los Alamitos, 1996, 271-275.

R.P.W. Duin, Small sample size generalization, in: G. Borgefors (eds.), SCIA'95, Proc. 9th Scandinavian Conf. on Image Analysis, Volume 2 (Uppsala, Sweden, June 6-9), 1995, 957-964.

R.P.W. Duin and E.Th.G. Hoek, SMD position measurement by a Kohonen network compared with image processing, in: V. Hlavac, R. Sara (eds.), Computer Analysis of Images and Patterns, Proc. 6th Int. Conf. CAIP'95 (Prague, CR, Sep.6-8), Springer, Berlin, 1995, 606-611.

G.M.P. van Kempen, L.J. van Vliet, and R.P.W. Duin, Fluorescence ratio imaging, in: J. van Katwijk, J.J. Gerbrands, M.R. van Steen, J.F.M. Tonino (eds.), ASCI'95, Proc. First Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 16-18), ASCI, Delft, 1995, 233-242.

A. Hoekstra and R.P.W. Duin, Exploring the capacity of simple neural networks, in: J. van Katwijk, J.J. Gerbrands, M.R. van Steen, J.F.M. Tonino (eds.), ASCI'95, Proc. First Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 16-18), ASCI, Delft, 1995, 56-62.

W.F. Schmidt, D.F. Levelt, and R.P.W. Duin, An experimental comparison of neural classifiers with traditional classifiers, in: E.S. Gelsema, L.N. Kanal (eds.), Pattern Recognition in Practice IV, Multiple Paradigms, Comparative Studies and Hybrid Systems (Proc. Conf. Vlieland NL, June 1-3), Elsevier, Amsterdam, 1994, 391-402.

M.A. Kraaijveld and R.P.W. Duin, The effective capacity of multilayer feedforward network classifiers, Proc. 12th IAPR Int. Conf. on Pattern Recognition, Volume II, Conf. B: Pattern Recognition and Neural Networks (ICPR12, Jerusalem, Israel, Oct. 9-13), IEEE Computer Society Press, Los Alamitos, CA, 1994, 99-103.

A.A. Manef, G. Sulong, A.R. Hamdan, R.P.W. Duin, and O.M. Rijal, Symbol recognition system for a telecommunication organization, Proc. Int. Conf. on Communications and Computer Networks, SEACOMM'94 (Kuala Lumpur, Malaysia, Oct.4-6), 1994, 385-391.

W.F. Schmidt, S. Raudys, M.A. Kraaijveld, M. Skurichina, and R.P.W. Duin, Initializations, back-propagation and generalization of feed-forward classifiers, Proc. 1993 IEEE Int. Conf. on Neural Networks (San Francisco, CA, March 28-April 1), 1993, 598-604.

R.R.N. Bakker, M.A. Kraaijveld, R.P.W. Duin, and W.F. Schmidt, On the speed of training networks with correlated features, Proc. 1993 IEEE Int. Conf. on Neural Networks (San Francisco, CA, March 28-April 1), 1993, 919-922.

R.P.W. Duin, Superlearning capabilities of neural networks?, SCIA93, Proc. of the 8th Scandinavian Conf. on Image Analysis (Tromso, Norway, May 25-28), NOBIM, Norwegian Society for Image Processing and Pattern Recognition, Tromso, Norway, 1993, 547-554.

R.P.W. Duin, Nearest neighbor interpolation for error estimation and classifier optimization, in: K.A. Hogda, B. Braathen, K. Heia (eds.), SCIA'93, Proc. of the 8th Scandinavian Conf. on Image Analysis (Tromso, Norway, May 25-28), NOBIM, Norwegian Society for Image Processing and Pattern Recognition, Tromso, Norway, 1993, 5-6.

R.D.T. Janssen, R.P.W. Duin, and A.M. Vossepoel, Evaluation method for an automatic map interpretation system for cadastral maps, Proc. 2nd IAPR Conf. Document Analysis and Recognition (ICDAR) (Tsukuba Science City, Japan, Oct.20-22), IEEE Computer Society Press, Los Alamitos, CA, 1993, 125-128.

W.F. Schmidt and R.P.W. Duin, Feed forward networks and the Cramer-Rao Bound, Proc. of the IJCNN, (Baltimore, MD, June 7-11), 1992, I-646 - I-651.

W.F. Schmidt, M.A. Kraaijveld, and R.P.W. Duin, Feed forward neural networks with random weights, Proc. 11th IAPR Int. Conf. on Pattern Recognition, Volume II, Conf. B: Pattern Recognition Methodology and Systems (ICPR11, The Hague, Aug.30 - Sep.3), IEEE Computer Society Press, Los Alamitos, CA, 1992, 1-4.

W.F. Schmidt, M.A. Kraaijveld, and R.P.W. Duin, A non-iterative method for training feed forward networks, Proc. Int. Joint Conf. on Neural Networks (Seattle, WA, July 8-12), IEEE, Piscataway, U.S.A., 1991, II-19 - II-24.

R.P.W. Duin, Patroonherkennen, Handboek Informatica, Samsom Bedrijfsinformatica, Alphen a/d Rijn, 1991, C2120-1 - C2120-7.

M.A. Kraaijveld and R.P.W. Duin, Generalization capabilities of minimal kernel-based networks, Proc. Int. Joint Conf. on Neural Networks (Seattle, WA, July 8-12), IEEE, Piscataway, U.S.A., 1991, I-843 - I-848.

J. Buurman and R.P.W. Duin, Comparing distance measures for object recognition using minimal view sets, in: P. Johansen, S. Olsen (eds.), Proc. of the 7th Scandinavian Conf. on Image Processing (Aalborg, Denmark, Aug.13-16), 1991, 966-973.

R.P.W. Duin, Pattern recognition and neural networks: A confrontation, Proc. Symposium Artificial Intelligence, Fundamentals and Applications (Delft, Dec.3), 1990, 49-58.

R.P.W. Duin and E.R. Komen, Massively parallel architectures for cellular logic image processing, in: V. Cantoni, L.P. Cordella, S. Levialdi, G. Sanniti di Baja (eds.), Progress in Image Analysis and Processing, World Scientific, Singapore, 1990, 643-657.

P.P. Jonker, F. Zeppenfeldt, S.T. Dekker, and R.P.W. Duin, Image processing using data flow based digital signal processors, Proc. Workshop on Parallel Processing (BARC, Bombay, India, Feb.7-9), 1990, IP14-IP26.

P.P. Jonker, E.R. Komen, and R.P.W. Duin, Architectures for Multidimensional Low- and Intermediate Level Image Processing, Proc. MVA'90: IAPR Workshop on Machine Vision and Applications (Tokyo, Nov.28-30), 1990, 307-316.

M. Bart, J. Buurman, and R.P.W. Duin, A learning procedure for the recognition of 3-D objects from 2-D images, SPIE Intelligent Robots and Computer Vision IX: Algorithms and Techniques, Proc. SPIE, vol. 1381, 1990, 66-77.

M.A. Kraaijveld and R.P.W. Duin, On backpropagation learning of edited data sets, Proc. of the Int. Neural Network Conf. (Paris, F, July 9-13), 1990, 741-744.

M.A. Kraaijveld and R.P.W. Duin, An optimal stopping criterion for backpropagation learning, Proc. IEEE Symposium on Neural Networks (Delft, June 21), 1990, 105-115.

J. Buurman and R.P.W. Duin, Object recognition using inexact matching of 3-D graphs, in: V. Cantoni, L.P. Cordella, S. Levialdi, G. Sanniti di Baja (eds.), Progress in Image Analysis and Processing, World Scientific, Singapore, 1990, 415-419.

E.R. Komen, W.B. Teeuw, R.P.W. Duin, and P.P. Jonker, Mapping an N*N Image on P Processors, Proc. MVA'90: IAPR Workshop on Machine Vision and Applications (Tokyo, Nov.28-30), 1990, 327-330.

R.P.W. Duin, The use of fuzzy labels in statistical pattern recognition, Proc. 6th Scandinavian Conf. on Image Analysis (Oulu, Finland, June 19-22), Pattern Recognition Society of Finland, 1989, 637-644.

E.P. Romsom and R.P.W. Duin, Model based recognition of 3-D objects from single 2-D images, Proc. Intelligent Autonomous Systems 2 (Amsterdam, Dec.11-14, 1989), IOS, 1989, 853-863.

R.P.W. Duin and P.P. Jonker, Processor arrays versus pipelines for cellular logic image operations, in: I.T. Young, J. Biemond, R.P.W. Duin, J.J. Gerbrands (eds.), Signal Processing III: Theories and Applications, North-Holland, Amsterdam, 1986, 1339-1343.

R.P.W. Duin and L. Dorst, On the optimal grid configuration for straight line position measurement, in: E. Backer, R.P.W. Duin, E.S. Gelsema, C. Kamminga, J.M. Valeton, A.M. Vossepoel (eds.), First Quinquennial Review 1981-1986 Dutch Society for Pattern Recognition and Image Processing, DEB Publishers, Pijnacker, 1986, 203-217.

R.P.W. Duin, H. Haringa, and R. Zeelen, A hardware design for fast 2-D percentile filtering, in: M.J.B. Duff, H.J. Siegel, F.J. Corbett (eds.), Architectures and Algorithms for Digital Image Processing (Proc. Conf. Cannes, France, Dec.3-6, 1985), Proc. SPIE, vol. 596, 1986, 36-40.

M.A. Kraaijveld, P.P. Jonker, R. Nouta, and R.P.W. Duin, The VLSI realisation of a binary-image processor, in: I.T. Young, J. Biemond, R.P.W. Duin, J.J. Gerbrands (eds.), Signal Processing III: Theories and Applications, North-Holland, Amsterdam, 1986, 1231-1234.

R.P.W. Duin and F.A. Gerritsen, The Delft image analysis laboratory: a multi-user facility for research, development and education of image analysis methods, in: J. Kittler, M.J.B. Duff (eds.), Image Processing System Architectures, Research Studies Press, Letchworth, England, 1985, 127-152.

P.P. Jonker and R.P.W. Duin, Consideration on a VLSI architecture for cellular logic operations, Proc. IEEE Computer Society Workshop on Computer Architecture for Pattern Analysis and Image Database Management (Miami Beach, FL, Nov.18-20), IEEE Computer Society Press, Silver Spring, MD, 1985, 453-462.

R.P.W. Duin, Interactive image processing in a multi-user environment, in: M.J.B. Duff (eds.), Computing Structures for Image Processing, Academic Press, London, 1983, 113-121.

R.P.W. Duin, Sample size considerations in discriminant analysis, Tweede Symposium over Informatietheorie in de Benelux (Zoetermeer, 21-22 mei), 1981, 49-52.

P.A. Riezebos, M. de Bruin, and R.P.W. Duin, Ore-textural and geochemical features of bohnerz and rasenerz concretions in Gutland (Luxembourg), Geologie en Mijnbouw, 1981, 517-529.

R.P.W. Duin, Needs and possibilities of using a priori knowledge in pattern recognition, Symposium over Informatietheorie in de Benelux (Zoetermeer, 29-30 mei), 1980, 47-51.

R.P.W. Duin, F.A. Gerritsen, F.C.A. Groen, P.W. Verbeek, and C.J.D.M. Verhagen, The Delft image processing system, design and use, Proc. 5th Int. Conf. on Pattern Recognition (Miami Beach, FL, Dec.1-4), 1980, 768-773.

R.P.W. Duin and B.J. Krose, On the possibility of avoiding peaking, Proc. 5th Int. Conf. on Pattern Recognition (Miami Beach, FL, Dec.1-4), 1980, 1375-1378.

R.P.W. Duin, J.A. de Vos, J.G.M. Bakker, R.R. de Boer, and E.H. Furnee, The recognition of muscle activity patterns for prosthesis control, Proc. SITEL-ULG Seminar on Pattern Recognition (Liege, Belgium, Nov.), 1977, 811-819.

R.P.W. Duin, A sample size dependent error bound, Proc. 3rd Int. Joint Conf. on Pattern Recognition (Coronado, CA, Nov.), 1976, 156-160.

R.P.W. Duin and C.E. van Haersma Buma, Some methods for the selection of independent binary features, Proc. 2nd Int. Joint Conf. on Pattern Recognition (Copenhagen, Aug.13-15), 1974, 65-70.

Reports

Y. Plasencia-Calana, E. Garcia-Reyes, R.P.W. Duin, and M. Orozco-Alzate, Prototype Selection Methods for Dissimilarity Space Classification, Internal Report RT_027, Cenatav, Havana, 2010, 1-18.

R.P.W. Duin, A.Ula, E.Pekalska, V.Murino, and P.Brambilla4, The Verona MRI brain images, a first analysis of the dissimilarities, SIMBAD (EU,FP7,FET), 2010, 1-460.

R.P.W. Duin and E. Pekalska, Study on (non)geometricity, Delivarable D3.1, SIMBAD (EU,FP7,FET), 2009, 1-33.

R.P.W. Duin and E. Pekalska, Datasets and tools for dissimilarity analysis in pattern recognition, Technical Report 2009_9, SIMBAD (EU,FP7,FET), 2009, 1-174.

D. Porro Munoz, I. Talavera Bustamante, and R.P.W. Duin, Multi-way data analysis, Internal Report RT_014, Cenatav, Havana, 2009, 1-53.

R.P.W. Duin, Structural class representation and pattern recognition by ETS; a commentary, unpublished, 2006, 1-13.

R.P.W. Duin, D.M.J. Tax, and A.K. Jain, Classifier Problem Archtypes, unpublished, 2006, 1-4.

R.P.W. Duin and E. Pekalska, Domain based classification, Unpublished, TUDelft, EEMCS,ICT, Delft, The Netherlands, 2005, 1-8.

T.C.W. Landgrebe, P. Paclik, D.M.J. Tax, and R.P.W. Duin, Summary and consolidation of AMANDA Research at Delft, 2003 to 2004, TSS Technology Technical Note, TN 2004-XX-XX, 2004, 1-47.

T.C.W. Landgrebe, P. Paclik, D.M.J. Tax, and R.P.W. Duin, Delft Work Package 4 for the Amanda classification problem - classifier combining, TSS Technology Technical Note, TN 2004-XX-XX, 2004, 1-191.

T.C.W. Landgrebe, P. Paclik, D.M.J. Tax, and R.P.W. Duin, Delft Work Package 1 for the Amanda classification problem - methodology, initial analysis, and software infrastructure, TSS Technology Technical Note, TN 2004-01-14, 2004, 1-139.

T.C.W. Landgrebe, D.M.J. Tax, and R.P.W. Duin, Delft Work Package 3 for the Amanda classification problem: One class classification, TSS Technology Technical Note, TN 2004-05-03, 2004, 1-124.

R.P.W. Duin, P. Juszczak, D. de Ridder, P. Paclik, E. Pekalska, and D.M.J. Tax, PRTools, a Matlab toolbox for pattern recognition, http://www.prtools.org, 2004.

P. Paclik, T.C.W. Landgrebe, D.M.J. Tax, and R.P.W. Duin, Delft Work Package 2 for the Amanda classification problem - data representation, TSS Technology Technical Note, TN 2004-05-02, 2004, 1-131.

T.C.W. Landgrebe, P. Paclik, and R.P.W. Duin, AMANDA Work Package 1, Methodology, initial analysis, and software infrastructure (Confidential) Technical Report PH-2003-03, De Beers Consolidated Mines Ltd, Pattern Recognition Group, Faculty of Applied Sciences, Delft University of Technology, Johannesburg, RSA, 2003, 1-141.

R.P.W. Duin and E. Pekalska, Zero-error dissimilarity based classifiers, Unpublished, TUDelft, Delft, The Netherlands, 2003, 1-4.

P. Paclik, S. Verzakov, and R.P.W. Duin, Hypertools: the toolbox for spectral image analysis version 1.0, Technical report, Pattern Recognition Group, TUDelft, 2003.

P. Paclik, R.P.W. Duin, G.M.P. van Kempen, and R. Kohlus, Segmentation of multi-spectral images using a combined classifier approach, Science & Technology Report, Unilever Research Vlaardingen, 2001, 1-20.

D.M.J. Tax, A. Ypma, and R.P.W. Duin, Analysis and improvement of a neural network based system for gas leak detection, Report for Shell Ortem, project TN-97-016, 1999, 1-49.

E. Pekalska, R.P.W. Duin, M.A. Kraaijveld, and D. de Ridder, Multidimensional scaling, theoretical aspects, Report for Shell- SIEP, Rijswijk, project TN-97-036, 1998, 1-47.

E. Pekalska, R.P.W. Duin, M.A. Kraaijveld, and D. de Ridder, Multidimensional scaling, applications to Shell data, Report for Shell-SIEP, Rijswijk, project TN-97-036, 1998, 1-37.

E. Pekalska, R.P.W. Duin, M.A. Kraaijveld, and D. de Ridder, An overview of multidimensional scaling techniques with application to Shell data, Report for Shell-SIEP, Rijswijk, project TN-97-036, 1998, 1-54.

D.M.J. Tax, A. Ypma, and R.P.W. Duin, A neural network based system for gas leak detection with hydrophone measurements, Report for Shell Expro, project TN-97-016, 1998, 1-48.

J.H. Weber, J.F.A. Quadt, E. Backer, R.P.W. Duin, S. de Jong, H.W. Lincklaen Westenberg, and W. Vaessen, Selection of attributes for panel classification using fuzzy set theory, LPDV 89 3054, Unilever Research Laboratorium, Vlaardingen, 1989, p. 35.

E. Backer, R.P.W. Duin, S. de Jong, H.W. Lincklaen Westenberg, D.A. van Meel, and J.A. Quadt, Fuzzy set theory applied to product classification by a sensory panel., PVD 85 3130, Unilever Research Laboratorium, Vlaardingen, 1985, 1-53.